Electron-beam-induced Contactless Manipulation of Interlayer Twist in van der Waals Heterostructures
Nicola Curreli, Tero S. Kulmala, Riya Sebait, Nicolò Petrini, Matteo Bruno Lodi, Roman Furrer, Alessandro Fanti, Michel Calame, Ilka Kriegel
TL;DR
This work demonstrates a non-contact method to actively reconfigure the twist between layers in graphene/hBN van der Waals heterostructures by electron-beam–induced charge injection. A grounded graphene stator and a decoupled hBN rotor form a nanoscale capacitor, where localized electron-beam charging of the hBN generates lateral electrostatic torque that drives in-plane rotation until a moiré‑energy minimum is reached. The rotation is tracked in real time by in-situ SEM and corroborated by twist-dependent Raman spectroscopy, revealing moiré‑pattern–driven changes in the graphene 2D peak and enabling estimation of the moiré wavelength and twist angle. While the method successfully overcomes static interlayer friction to induce small, directionally biased twists, the actuation is currently irreversible and subject to the energy landscape of the moiré potential; nonetheless, the results establish a foundation for on-chip, non-contact twist control with potential applications in optoelectronics, photonics, and quantum materials.
Abstract
The ability to dynamically control the relative orientation of layers in two dimensional (2D) van der Waals (vdW) heterostructures represents a critical step toward the realization of reconfigurable nanoscale devices. Existing actuation methods often rely on mechanical contact, complex architectures, or extreme operating conditions, which limit their applicability and scalability. In this work, we present a proof-of-concept demonstration of contactless electrostatic actuation based on electron-beam-induced charge injection. By locally charging an insulating hexagonal boron nitride (hBN) flake on an electrically grounded graphene layer, we create an interfacial electric field that generates in-plane electrostatic torque and induces angular displacement. We validate the induced rotation through in-situ scanning electron microscopy (SEM) and twist-dependent Raman spectroscopy.
