Quantum-Limited Optical Vector Analysis
Karthik Dasigi, Pavel A. Dmitriev, Kah Jen Wo, Fumiya Hanamura, Lingda Kong, Steven Touzard
TL;DR
This work introduces a quantum-limited Optical Vector Analysers (OVA) using a free-running balanced-heterodyne interferometer to achieve high-sensitivity, wideband measurements without sacrificing practicality. By mitigating phase noise in hardware and correcting residual noise in software, the approach reaches near-SQL sensitivity over a 20 THz span and enables coherent vector measurements at the single-photon level, characterized by an efficiency of about $\eta \approx 0.64$. Application to thin-film Lithium Niobate microring resonators yields internal quality factors $Q_{int} > 5\times 10^{6}$, demonstrating low internal losses and high fabrication quality. The method offers a practical, scalable pathway for high-sensitivity metrology of photonic components, with potential impact on integrated photonics, quantum information processing, and advanced sensing.
Abstract
Optical Vector Analysers (OVA) are critical for emerging technologies such as integrated photonics and optical positioning. Achieving a sensitivity near the Standard Quantum Limit (SQL) while acquiring a wide spectrum allows an accurate measurement of targets that are fragile, non-linear, or that scatter most of the probe light away. Existing OVAs operate with a sensitivity orders of magnitude below the SQL. In this paper, we use a free-running interferometer with a frequency range of 20 THz as an OVA. We introduce novel methods to mitigate the phase noise and obtain a unit signal-to-noise ratio for powers at the fW level. We apply this technique towards quantifying the fabrication quality of microring resonators in thin-film Lithium Niobate. Our characterisation yields a signal-to-noise ratio above 1 with much less than 1 circulating photon and reveals a quality factor above 5 millions, unambiguously attributed to low internal losses.
