Spatial distribution of secondary electrons' Synchrotron emission: property and implication
Qi-Zuo Wu, Ruo-Yu Liu
TL;DR
The paper tackles the problem of differentiating hadronic from leptonic origins of ultrahigh-energy γ-ray sources by studying the spatial morphology of X-ray synchrotron emission from secondary electrons. It develops a diffusion-based transport framework with $D(E)=D_0\left(E/1\,\mathrm{GeV}\right)^{1/2}$ and $n_0=10\,{\rm cm}^{-3}$ for a source at $d=5$ kpc over $T_{\rm age}=2$ Myr, comparing hadronic and leptonic scenarios and including Klein-Nishina effects. A key finding is that secondary-electron synchrotron can produce a flat X-ray surface-brightness profile (SBP) and distinctive photon-index profiles, offering a morphological diagnostic alongside spectra to identify PeVatrons; the study also shows how an offset molecular cloud can create complex, yet interpretable, γ-ray and X-ray morphologies. Hybrid cases with primary electrons are explored, revealing parameter regimes where X-ray morphology still preserves hadronic signatures. Overall, the work demonstrates that X-ray morphology and spectral behavior together provide a powerful tool for pinpointing the radiation mechanism of UHE γ-ray sources and constraining PeV cosmic-ray accelerators.
Abstract
Galactic $γ$-ray sources can be produced by either high-energy protons via proton-proton collisions or electrons/positrons via inverse Compton scattering. Distinguishing between the hadronic and leptonic origin of $γ$-ray emission in Galactic sources remains challenging. Measurements of non-thermal X-ray spectra of these sources, which could originate from primary electrons in the leptonic scenario or secondary electrons/positrons in the hadronic scenario, have been suggested as an efficient way of discriminating between these scenarios. In this work, we investigate the morphology of the X-ray emission from secondary electrons/positrons. By calculating the surface brightness profile and the photon index profile of X-ray emission, we find that secondary electrons produce a distinctively flat X-ray surface brightness profile. Our results suggest that, in addition to the X-ray spectrum, the X-ray morphology is crucial to determine the radiation mechanism of ultrahigh-energy $γ$-ray sources and help to identify sources of PeV cosmic rays.
