Stochastic ion emission perturbation mechanisms in atom probe tomography: Linking simulations to experiment
Aslam Shaikh, Tero Mäkinen, François Vurpillot, Mikko Alava, Ivan Lomakin
TL;DR
Atom probe tomography simulations suffer trajectory artefacts from surface diffusion and roll-up. The authors introduce two physically motivated stochastic perturbations—lateral velocity perturbations $E_\perp$ and a roll-up mechanism—into the Robin--Rolland model, and validate against Al and Ni experiments using SSIM to compare detector maps. The energy distributions that maximize structure similarity differ by material, with Al favoring a high-mean, moderately dispersed $E_\perp$ and Ni favoring a lower-mean, highly dispersed distribution, yielding substantially improved agreement over previous models. This work provides a physics-based, scalable perturbation framework that enhances reconstruction fidelity and motivates future MD-informed refinements and expansion to additional field-evaporation effects.
Abstract
Field evaporation in atom probe tomography (APT) includes known processes related to surface migration of atoms, such as the so-called roll-up mechanism. They lead to trajectory aberrations and artefacts on the detector. These processes are usually neglected in simulations. The inclusion of such processes is crucial for providing reliable models for the development and verification of APT reconstruction algorithms, a key part of the whole methodology. Here we include stochastic lateral velocity perturbations and a roll-up mechanism to simulations performed using the Robin--Rolland model. By comparing with experimental data from Al and Ni systems, we find the stochastic perturbation energy distributions that allow us to very accurately reproduce the detector patterns seen experimentally and thus greatly improve the accuracy of the simulations. We also explore the possible causes of remaining discrepancies between the experimental and simulated detector patterns.
