Response of AC-coupled Low Gain Avalanche Detectors to Ionizing and Non-ionizing Radiation Damage
Jiahe Si, Gabriele D'Amen, Mohamed Hijas Mohamed Farook, Gabriele Giacomini, Martin R. Hoeferkamp, Sally Seidel, Alessandro Tricoli
TL;DR
This work assesses radiation hardness of AC-coupled LGADs (AC-LGADs) relative to DC-LGADs under ionizing gamma and non-ionizing proton damage. Using IV and CV measurements, the study quantifies leakage currents, depletion voltages ($V_{gl}$ and $V_{fd}$), and inter-pad surface resistivity, and extracts acceptor-removal constants by fitting $V_{gl}$ versus dose/fluence to exponential forms. Key findings show gamma exposure modestly alters depletion voltages and introduces CV frequency dependence, while proton exposure dramatically increases leakage current and reduces depletion voltages, with AC-LGADs exhibiting somewhat lower damage than DC counterparts. The derived constants, $c_{\gamma}$ for AC-LGADs and $c_{ni}$ for AC-/DC-LGADs, are consistent with prior measurements, providing quantitative inputs for designing LGAD-based sensors for high-radiation environments.
Abstract
Low gain avalanche diodes with DC- and AC-coupled readout were exposed to ionizing and non-ionizing radiation at levels relevant to future experiments in particle, nuclear, and medical physics and to astrophysics. Damage-related change in their acceptor removal constants and in the resistivity of the region between the guard ring and the active area are reported, as is change in the leakage current and depletion voltages of the active volumes.
