Metallic Contact Contributions in Thermal Hall Conductivity Measurements
Hongyu Ma, Xuesong Hu, Junren Shi
TL;DR
The paper addresses how metallic contacts can generate spurious thermal Hall signals in measurements of the thermal Hall effect by bypassing heat flow and creating a transverse temperature gradient under a magnetic field. It develops analytic and finite-element models for electrode and wire contacts, deriving an apparent $\kappa_{xy}^{\mathrm{app.}}$ and a geometry correction factor $\delta$ that depends on contact geometry and material properties, and then fits data from diverse materials under the assumption of zero intrinsic $\kappa_{xy}$ to estimate contact influence. The key finding is that modest contact thicknesses relative to sample width (roughly $t/W \sim 10^{-2}$ to a few $\times 10^{-2}$) with silver-like conductivity can reproduce the observed $\kappa_{xy}$ trends across materials, especially when accounting for geometric corrections; this underscores the importance of accounting for contact artifacts in THE measurements and motivates a long-arm, low-leakage measurement geometry to suppress these effects. The work provides practical guidance for designing experiments to minimize contact-induced artifacts, thereby improving the reliability of THE signals used to probe neutral heat carriers.
Abstract
We investigate the influence of metallic contacts on thermal Hall measurements. By analyzing typical measurement setups, we show that heat currents bypassing through metallic contacts could generate non-negligible thermal Hall signals. We find that contributions from metallic contacts with thicknesses on the order of 10$^{-2}$ of sample widths can approximately replicate experimental observations across different materials in both temperature dependence and magnitude, assuming silver contacts with a conductivity of $10^{8}~\mathrm{S/m}$. Our analysis underscores the need to minimize metallic contact effects in thermal Hall measurements, which can be achieved by optimizing measurement configurations.
