Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization
Shion Takeno, Yu Inatsu, Masayuki Karasuyama, Ichiro Takeuchi
TL;DR
This paper addresses regret analysis for expected-improvement–based Bayesian optimization by introducing GP-EIMS, a posterior-sampling–based GP-EI variant that uses the maximum of a posterior sample path as the reference and avoids rescaling the posterior variance. It proves sublinear Bayesian cumulative regret bounds under a Gaussian-process prior and derives finite- and continuous-domain bounds for the Bayesian cumulative regret (BCR). Empirically, GP-EIMS demonstrates strong performance comparable to or exceeding other EI-based methods and closely tracking GP-PIMS, while avoiding variance-rescaling drawbacks. The work thus provides both theoretical guarantees and practical robustness for EI-based Bayesian optimization without variance scaling.
Abstract
Bayesian optimization is a powerful tool for optimizing an expensive-to-evaluate black-box function. In particular, the effectiveness of expected improvement (EI) has been demonstrated in a wide range of applications. However, theoretical analyses of EI are limited compared with other theoretically established algorithms. This paper analyzes a randomized variant of EI, which evaluates the EI from the maximum of the posterior sample path. We show that this posterior sampling-based random EI achieves the sublinear Bayesian cumulative regret bounds under the assumption that the black-box function follows a Gaussian process. Finally, we demonstrate the effectiveness of the proposed method through numerical experiments.
