Determining the complex second-order optical susceptibility in macroscale van der Waals heterobilayers
Zeyuan Zhu, Taejun Yoo, Kanchan Shaikh, Amalya C. Johnson, Qiuyang Li, Fang Liu, Hui Deng, Yuki Kobayashi
TL;DR
This work establishes a quantitative framework for the complex second-order susceptibility $\chi^{(2)}$ in macroscale MoSe$_2$/WS$_2$ heterobilayers by employing heterodyne second-harmonic generation (SHG). The authors resolve crystal-domain phases and stacking configurations, extracting $d_{22}$ and $\phi$ for both monolayers and the heterobilayer, and they show that interlayer contributions to SHG are below $1\%$ of the total signal under their conditions, with phase information remaining robust over hundreds of microns. The methodology combines a phase-controlled SHG interferometer with mm-scale sample fabrication (gold-tape exfoliation and 1-dodecanol passivation) to map crystallographic orientations and assess interlayer coupling. These results provide a practical upper bound on interlayer effects for stacking-engineered nanophotonic devices and highlight sample inhomogeneity as the dominant source of magnitude uncertainty, guiding future design and measurement at varying wavelengths.
Abstract
We report on the experimental characterization of the second-order susceptibility in MoSe$_2$/WS$_2$ heterobilayers, including their hidden complex phases. To this end, we developed a heterodyne-detection scheme for second-harmonic generation and applied it to macroscale heterobilayer samples prepared using the gold-tape exfoliation method. The heterodyne scheme enabled us to distinguish the relative orientation of the crystal domains, and further, it allowed us to characterize the complex phases of the susceptibility relative to a reference quartz sample. By comparing the results from the monolayer regions and the heterobilayer region over several hundred microns of the sample area, we determined that the contribution of interlayer effects to second-harmonic generation is within the experimental uncertainty arising from the sample inhomogeneity. The results here provide fundamental quantitative information necessary for the precise design of nanophotonic systems based on stacking engineering.
