A Leptonic Interpretation of the UHE Gamma-ray Emission from V4641 Sgr
Su-Yu Wan, Jie-shuang Wang, Ruo-Yu Liu
TL;DR
The paper investigates whether leptonic processes can explain the UHE gamma-ray emission from V4641 Sgr, observed up to $0.8\, \mathrm{PeV}$, by invoking inverse Compton scattering from electrons accelerated along a velocity-shear jet. It develops a joint stochastic and shear acceleration framework, solves a Fokker-Planck equation to obtain the electron spectrum, and computes IC and X-ray synchrotron emission using seed photon fields, incorporating KN effects.Through MCMC fitting to LHAASO/HAWC/H.E.S.S data, the study finds that SHA can reproduce the observed spectrum with magnetized jets of order $\mu$G and spine speeds around $0.6-0.7\,c$, with an electron kinetic luminosity near $10^{37}\rm\ erg\ s^{-1}$. XRISM X-ray limits favor a jet radius $R_{\rm jet}\gtrsim 1$ pc and predict an elongated X-ray/TeV structure that can be tested with future high-resolution instruments. The work also discusses robustness to the turbulence spectrum and jet–orbit misalignment, arguing that the leptonic SHA scenario provides a viable alternative to hadronic models for the extended UHE emission.
Abstract
Recently, the microquasar V4641 Sgr and its surrounding is detected at TeV-PeV gamma-ray band. Interestingly, the spectrum follows a power-law function continuing up to 0.8 PeV as reported by LHAASO, and the morphology of the emission appears a puzzling elongated structure. In this work, we propose that the elongated UHE emission from V4641 Sgr could originate from the inverse Compton radiation of electrons with a very hard spectrum, which may result from shear acceleration mechanism in the jets driven by V4641 Sgr. We also calculate the corresponding X-ray synchrotron emission from the same electron population, predicting the potential range of non-thermal X-ray flux of the source. The recent observation by XRISM toward the central part of the UHE source could pose a constraint on the model parameters. In the future, a full coverage of the source by sensitive X-ray instrument and high-resolution TeV-PeV gamma-ray instrument may provide a critical test of the model.
