Efficient Characterization of Coherent and Correlated Low-Degree Noise in Layers of Gates
Marianna Crupi, J. Ignacio Cirac, Flavio Baccari
TL;DR
This work tackles scalable noise characterization for quantum gates by introducing a low-degree Pauli-channel ansatz and an efficient tomography protocol based on randomized Pauli state preparation and measurements. It achieves logarithmic sample complexity in the system size and provides explicit reconstruction guarantees in $\ell_2$ and diamond norms for the error channel $\mathcal{E}$, even when the hardware implements a gate layer $\mathcal{U}$, by performing the inversion in classical postprocessing. The method generalizes to layers with a polylogarithmic number of non-Clifford gates and includes strategies to bound variance and control resources, with numerical simulations validating the approach up to sizable qubit numbers. Practically, this enables efficient, SPAM-tolerant noise characterization and isolation of coherent noise and crosstalk in near-term quantum devices.
Abstract
We present a quantum process-tomography protocol based on a low-degree ansatz for the quantum channel, i.e. when it can be expressed as a fixed-degree polynomial in terms of Pauli operators. We demonstrate how to perform tomography of such channels with a logarithmic amount of effort relative to the size of the system, by employing random state preparation and measurements in the Pauli basis. We extend the applicability of the protocol to channels consisting of a layer of quantum gates with a polylogarithmic number of non-Clifford gates, followed by a low-degree noise channel. Rather than inverting the layer of quantum gates on the hardware-which would introduce additional errors-we instead carry out the inversion in classical postprocessing, while adding to the sample complexity a factor at most polynomial in system size. Numerical simulations support our theoretical findings and demonstrate the feasibility of our method.
