Quantifying Spin Defect Density in hBN via Raman and Photoluminescence Analysis
Atanu Patra, Paul Konrad, Andreas Sperlich, Timur Biktagirov, Wolf Gero Schmidt, Lesley Spencer, Igor Aharonovich, Sven Höfling, Vladimir Dyakonov
TL;DR
The paper addresses the challenge of quantifying absolute spin-defect density for $V_B^-$ centers in ultrathin hBN. It develops an all-optical method that correlates defect-related Raman features (D1 and D2) and photoluminescence with irradiation fluence, supported by polarization-resolved measurements and DFT calculations. A graphene-inspired phenomenological model connects Raman and PL intensities to a defect-spacings parameter $L_D$, yielding a quantitative spin density $n_D$ that follows a power law with fluence and remains broadly universal across irradiation types. This approach provides a direct, non-destructive readout of spin-defect density in thin hBN, enabling robust benchmarking and optimization of hBN-based quantum photonic devices.
Abstract
Negatively charged boron vacancies ($\mathrm{V_B^-}$) in hexagonal boron nitride (hBN) are emerging as promising solid-state spin qubits due to their optical accessibility, structural simplicity, and compatibility with photonic platforms. However, quantifying the density of such defects in thin hBN flakes has remained elusive, limiting progress in device integration and reproducibility. Here, we present an all-optical method to quantify $\mathrm{V_B^-}$ defect density in hBN by correlating Raman and photoluminescence (PL) signatures with irradiation fluence. We identify two defect-induced Raman modes, D1 and D2, and assign them to vibrational modes of $\mathrm{V_B^-}$ using polarization-resolved Raman measurements and density functional theory (DFT) calculations. By adapting a numerical model originally developed for graphene, we establish an empirical relationship linking Raman (D1, $E_\mathrm{2g}$) and PL intensities to absolute defect densities. This method is universally applicable across various irradiation types and uniquely suited for thin flakes, where conventional techniques fail. Our approach enables accurate, direct, and non-destructive quantification of spin defect densities down to $10^{15}$ defects/ cm${}^3$, offering a powerful tool for optimizing and benchmarking hBN for quantum optical applications.
