Phase Matching Free Sensing with Undetected Light Using a Nonlinear Thin-Film Metasurface
Toby Severs Millard, Nathan Gemmell, Ross C. Schofield, Mohsen Rahmani, Alex S. Clark, Chris C. Phillips, Rupert F. Oulton
TL;DR
This work addresses phase matching free sensing with undetected light using a thin-film nonlinear source. It demonstrates stimulated four-wave mixing in a resonant plasmonic metasurface within a folded Michelson interferometer and derives a visibility model $V = \frac{2\sqrt{\kappa T T_f}(\eta + \sqrt{T_f R_f})}{R_f T_f + (\eta^2 + T_f)(1 + \kappa T)}$, with $\kappa = T_p^2 T_s$ and $\eta = \frac{\sigma_-}{\sigma_+}$. Experimentally, a maximum visibility greater than 50% is observed while sensing through a 240 μm silicon window, and phase information is retrieved despite reduced visibility, demonstrating undetected-light sensing. Spectroscopic dispersion measurements show ultrafast, spectrally resolved sensing capabilities and indicate potential extension to deeper mid-IR wavelengths, where metasurface resonances define the operating bands.
Abstract
In this article, we report classical sensing with undetected light using octave spanning stimulated four-wave mixing from a plasmonic metasurface. The bidirectional nonlinear scattering due to inherent reflections from such thin nonlinear materials modifies their operation within a nonlinear interferometer. The theoretical model for visibility accounting for such bidirectionality as well as pulsed illumination accurately predicts visibility in the system as a function of transmission in the near-infrared seed (idler) arm. Spectrally resolving the visible signal emission evaluates the total dispersion within the interferometer, highlighting the prospect of ultrafast sensing with undetected photons.
