Tabletop Lensless Imaging in the Extreme Ultraviolet with Reduced Radiation Dose
Sukyoon Oh, Monalisa Mallick, Thomas Siefke, Christian Spielmann
TL;DR
The paper demonstrates a lensless, tabletop XUV imaging platform that uses high-harmonic generation and correlation-based ghost imaging to achieve micrometer-scale imaging with dramatically reduced radiation dose. By systematically evaluating illumination patterns (Hadamard, differential Hadamard, Fourier, and random) and reconstruction methods (traditional GI and compressive sensing), the authors show Hadamard-based strategies offer superior reconstruction quality, especially when combined with CS. A data-processing pipeline—encompassing pattern calibration, real-pattern usage, histogram equalization, and noise-cropped bucket data—yields up to a ~400% improvement in image similarity metrics over baseline conditions, validating a robust, low-dose approach for non-destructive inspection of delicate materials. The work broadens access to XUV microscopy, highlighting practical pathways toward compact, optics-free, dose-efficient imaging suitable for materials science and biology.
Abstract
High-resolution extreme ultraviolet (XUV) imaging remains limited by conventional approaches that require complex optics such as multilayer mirrors and zone plates. These methods are expensive, suffer from chromatic aberrations and narrow fields of view, and demand highly stable, coherent beam sources typically found only at large-scale facilities. Critically, the high photon flux they require often damages sensitive biological and soft-matter samples. We present a new solution: a lensless XUV microscopy platform combining a compact tabletop high-harmonic generation source with correlation-based ghost imaging. Our approach eliminates the need for complex optics, lowering system cost and dramatically improving resilience against lab-scale instabilities. Leveraging Hadamard patterns and compressive sensing algorithms, we achieve high-fidelity imaging even in low-photon environments, with a 400\% improvement in structural similarity index compared to baseline methods. This confirms the feasibility of broadband, low-dose XUV imaging, enabling damage-minimized, non-destructive inspection for advanced materials and biological specimens, and establishes a new paradigm for accessible XUV microscopy.
