Creation and Microscopic Origins of Single-Photon Emitters in Transition Metal Dichalcogenides and Hexagonal Boron Nitride
Amedeo Carbone, Diane-Pernille Bendixen-Fernex de Mongex, Arkady V. Krasheninnikov, Martijn Wubs, Alexander Huck, Thomas W. Hansen, Alexander W. Holleitner, Nicolas Stenger, Christoph Kastl
TL;DR
This review surveys irradiation- and strain-based methods to create single-photon emitters in 2D van der Waals materials, focusing on hBN and TMDCs. It emphasizes the diverse defect classes, the mechanisms of defect creation and activation, and the experimental/theoretical efforts to link atomic structure to optical signatures using PLE, STM/CL, and ab-initio calculations. A central theme is the unsettled atomistic origin of many emitters, particularly in hBN, with V_B^- centers, carbon-based complexes, and sulfur vacancies as leading candidates, while strain and defect-bound states shape TMDC emission. The authors advocate a theory-guided, open-data approach combining high-throughput computations, correlative atomistic characterization, and standardized fabrication to achieve deterministic, scalable quantum emitters in 2D materials and enable practical quantum photonic devices.
Abstract
We highlight recent advances in the controlled creation of single-photon emitters in van der Waals materials and in the understanding of their atomistic origin. We focus on quantum emitters created in monolayer transition-metal dichalcogenide semiconductors, which provide spectrally sharp single-photon emission at cryogenic temperatures, and the ones in insulating hBN, which provide bright and stable single-photon emission up to room temperature. After introducing the different classes of quantum emitters in terms of band-structure properties, we review the defect creation methods based on electron and ion irradiation as well as local strain engineering and plasma treatments. A main focus of the review is put on discussing the microscopic origin of the quantum emitters as revealed by various experimental platforms, including optical and scanning probe methods.
