The Double Descent Behavior in Two Layer Neural Network for Binary Classification
Chathurika S Abeykoon, Aleksandr Beknazaryan, Hailin Sang
TL;DR
This work investigates the double descent phenomenon in binary classification using a two-layer ReLU network under an over- and under-parameterized regime characterized by the ratio $\alpha=\frac{n}{d}$. It avoids explicit training dynamics by employing the Convex Gaussian Min-Max Theorem (CGMT) and Legendre transforms to derive asymptotic generalization error curves, providing fixed-point equations for key quantities $r^*,s^*,b^*,\gamma^*$ in the square-loss setting. The authors show that, at low regularization, the test error exhibits a second descent near the interpolation threshold, while increasing $\lambda=\lambda(d)$ mitigates or eliminates this peak, yielding monotone improvements with more data. The results offer a theoretical account of ratio-wise double descent and demonstrate how appropriate regularization can align the model’s behavior with classical bias-variance intuition, with implications for high-dimensional binary classification and the design of regularization strategies.
Abstract
Recent studies observed a surprising concept on model test error called the double descent phenomenon, where the increasing model complexity decreases the test error first and then the error increases and decreases again. To observe this, we work on a two layer neural network model with a ReLU activation function designed for binary classification under supervised learning. Our aim is to observe and investigate the mathematical theory behind the double descent behavior of model test error for varying model sizes. We quantify the model size by the ratio of number of training samples to the dimension of the model. Due to the complexity of the empirical risk minimization procedure, we use the Convex Gaussian Min Max Theorem to find a suitable candidate for the global training loss.
