Curvilinear Mask Optimization for Inverse Lithography Based on B-splines and Delaunay Triangulation
Xiaoru Yi, Junqing Chen
TL;DR
This work introduces a gradient-based inverse lithography approach for curvilinear mask optimization by representing mask boundaries with periodic B-splines. It couples Delaunay triangulation of the spline-defined regions with explicit gradient relations between control points and sampling points to enable efficient optimization. An unconstrained objective with a sigmoid-transformed threshold is minimized to match target image intensities, and the authors provide a complete workflow from region discretization to gradient computation. Numerical experiments across diverse patterns demonstrate the method's adaptability and potential for producing manufacturable, high-fidelity curvilinear masks. The approach reduces edge placement errors and handles multiple regions effectively, with detailed analysis of accuracy and computational cost.
Abstract
In this paper, we propose a novel gradient-based method to optimize curvilinear masks in optical lithography. The mask pattern is represented by periodic B-spline curves. We apply Delaunay triangulation to discretize the domains circled by the spline curves. Subsequently, we establish an explicit relationship between the integral points and the control points of the boundary spline curve. Based on the relationship, we derive explicit formulas of the gradient of the optimization objective function with respect to the coordinates of the control points. Then we propose an inverse lithography algorithm to optimize the curvilinear mask pattern. Finally, the results of the numerical experiments demonstrate the feasibility and extensive adaptability of our method.
