Camera Model Identification with SPAIR-Swin and Entropy based Non-Homogeneous Patches
Protyay Dey, Rejoy Chakraborty, Abhilasha S. Jadhav, Kapil Rana, Gaurav Sharma, Puneet Goyal
TL;DR
The paper tackles the challenge of source camera model identification (SCMI) by introducing SPAIR-Swin, a architecture that fuses a SPAIR block with the Swin Transformer to capture both global and local camera-specific artifacts. A novel entropy-based patch extraction strategy selects high-information regions likely to carry distinctive sensor noise and processing traces, improving discriminability. Empirical results on Dresden, Vision, Forchheim, and Socrates datasets show state-of-the-art image-level and patch-level accuracies, with substantial gains over multiple baselines and evidence that high-entropy patches are particularly informative. The approach offers a practical path for robust SCMI in forensic contexts, and code availability is noted upon request.
Abstract
Source camera model identification (SCMI) plays a pivotal role in image forensics with applications including authenticity verification and copyright protection. For identifying the camera model used to capture a given image, we propose SPAIR-Swin, a novel model combining a modified spatial attention mechanism and inverted residual block (SPAIR) with a Swin Transformer. SPAIR-Swin effectively captures both global and local features, enabling robust identification of artifacts such as noise patterns that are particularly effective for SCMI. Additionally, unlike conventional methods focusing on homogeneous patches, we propose a patch selection strategy for SCMI that emphasizes high-entropy regions rich in patterns and textures. Extensive evaluations on four benchmark SCMI datasets demonstrate that SPAIR-Swin outperforms existing methods, achieving patch-level accuracies of 99.45%, 98.39%, 99.45%, and 97.46% and image-level accuracies of 99.87%, 99.32%, 100%, and 98.61% on the Dresden, Vision, Forchheim, and Socrates datasets, respectively. Our findings highlight that high-entropy patches, which contain high-frequency information such as edge sharpness, noise, and compression artifacts, are more favorable in improving SCMI accuracy. Code will be made available upon request.
