Extensions of regret-minimization algorithm for optimal design
Youguang Chen, George Biros
TL;DR
This work extends regret-minimization approaches to optimal experimental design by incorporating an entropy regularizer, yielding a novel sample-selection objective and provable near-optimality with a tilde-$O$(d/ε^2) sample complexity and potential data-dependent improvements. It further generalizes the framework to regularized designs (ridge regression) with matching complexity guarantees, and demonstrates practical utility by selecting unlabeled subsets for image classification tasks (MNIST, CIFAR-10, ImageNet-50) where models trained on the selected samples approach or surpass baselines. The proposed algorithm proceeds via a convex relaxation of the combinatorial design problem, followed by a rounding step implemented through Follow-the-Regularized-Leader (FTRL) with closed-form updates for multiple regularizers, and rigorous bounds back the rounding quality. Empirically, Regret-min with entropy regularization often matches or outperforms alternatives across diverse datasets and design criteria, with advantages in learning-rate stability and representativeness of selected unlabeled samples for downstream classifiers.
Abstract
We explore extensions and applications of the regret minimization framework introduced by~\cite{design} for solving optimal experimental design problems. Specifically, we incorporate the entropy regularizer into this framework, leading to a novel sample selection objective and a provable sample complexity bound that guarantees a $(1+ε)$-near optimal solution. We further extend the method to handle regularized optimal design settings. As an application, we use our algorithm to select a small set of representative samples from image classification datasets without relying on label information. To evaluate the quality of the selected samples, we train a logistic regression model and compare performance against several baseline sampling strategies. Experimental results on MNIST, CIFAR-10, and a 50-class subset of ImageNet show that our approach consistently outperforms competing methods in most cases.
