Rydberg atomic polarimetry of radio-frequency fields
Matthew Cloutman, Matthew Chilcott, Alexander Elliott, J. Susanne Otto, Amita B. Deb, Niels Kjærgaard
TL;DR
Rydberg-atom RF sensing uses EIT in Rydberg ladders to transduce RF-field amplitudes into optical signals. The authors develop a dressed-state polarization-resolved framework that identifies Type-I and Type-II ladders, each with distinct EIT signatures, and validate it with experiments on ${}^{87}$Rb and density-matrix simulations. They show that the presence or absence of a central EIT peak at $ riangle_c=0$ depends on the ladder type and RF polarization, challenging simplified four-level interpretations. This work lays groundwork for SI-traceable, polarization-resolving quantum metrology and motivates machine-learning approaches to reconstruct arbitrary RF polarization from spectrograms.
Abstract
Rydberg atoms efficiently link photons between the radio-frequency (RF) and optical domains. They furnish a medium in which the presence of an RF field imprints on the transmission of a probe laser beam by altering the coherent coupling between atomic quantum states. The immutable atomic energy structure underpins quantum-metrological RF field measurements and has driven intensive efforts to realize inherently self-calibrated sensing devices. Here we investigate spectroscopic signatures owing to the angular momentum quantization of the atomic states utilized in an electromagnetically-induced transparency (EIT) sensing scheme for linearly polarized RF fields. Specific combinations of atomic terms are shown to give rise to universal, distinctive fingerprints in the detected optical fields upon rotating the RF field polarization. Using a dressed state picture, we identify two types of atomic angular momentum ladders that display strikingly disparate spectroscopic signatures, including the complementary absence or presence of a central spectral EIT peak. Our study adds important insights into the prospects of Rydberg atomic gases for quantum metrological electric field characterization. In particular, it calls into question prevailing interpretations of SI-traceable Rydberg atom electrometers.
