Data-driven continuation of patterns and their bifurcations
Wenjun Zhao, Samuel Maffa, Björn Sandstede
TL;DR
The work addresses delineating parameter-domain boundaries between distinct spatial patterns in reaction-diffusion and related systems by building pattern statistics from ensembles of randomized initial data and comparing them with the 2-Wasserstein distance $d_W$. It introduces a probabilistic framework where sublevel-set patterns $A(u)=u^{-1}((- fty,c])$ yield feature functions (e.g., connected components, area distributions, roundness) and a statistic $oldsymbol{ u}_f(p)$ that depends continuously on parameters. Bifurcation curves are traced by maximizing the rate of change of pattern statistics along predictor-corrector arclength continuations, using an objective $G_f(p,q)=d_W(oldsymbol{ u}_f(p),oldsymbol{ u}_f(q))$ and a finite-difference bifurcation surrogate. The approach is demonstrated across numerous PDE models and a stochastic ABM, providing a flexible, automated method to compute pattern boundaries without bespoke boundary-value formulations, with robust behavior under various discretization and sampling choices. It offers a path toward parameter inference and multi-parameter extensions in complex pattern-forming systems.
Abstract
Patterns and nonlinear waves, such as spots, stripes, and rotating spirals, arise prominently in many natural processes and in reaction-diffusion models. Our goal is to compute boundaries between parameter regions with different prevailing patterns and waves. We accomplish this by evolving randomized initial data to full patterns and evaluate feature functions, such as the number of connected components or their area distribution, on their sublevel sets. The resulting probability measure on the feature space, which we refer to as pattern statistics, can then be compared at different parameter values using the Wasserstein distance. We show that arclength predictor-corrector continuation can be used to trace out transition and bifurcation curves in parameter space by maximizing the distance of the pattern statistics. The utility of this approach is demonstrated through a range of examples involving homogeneous states, spots, stripes, and spiral waves.
