Measuring dark currents in multiple cryogenic SiPMs with sub-pA sensitivity using an automated IV multiplexer
Lucas Darroch, Eamon Egan, Marc-Antoine Leclerc, Thomas McElroy, Thomas Brunner
TL;DR
The paper addresses the challenge of high-sensitivity dark-current measurements in large cryogenic SiPM arrays by introducing an automated, vacuum-compatible IV multiplexer (IV-MUX). The design enables up to 105 channels controlled by a single Arduino, using guard rings and high-isolation relays to achieve sub-$49$ fA resolution, while supporting both static IV and dynamic pulse-counting modes. Validation occurs through vacuum tests with a 16-channel SiPM array and LN tests with a 4-channel SiPM, showing excellent agreement between IV and dynamic measurements and revealing practical considerations like burst events influencing the effective DCR. The open-source IV-MUX reduces measurement time and hardware complexity for large-scale detector tests, facilitating rapid, automated characterization of SiPMs and similar low-current devices in cryogenic and vacuum environments.
Abstract
We present the design of an automated current-voltage (IV) multiplexer (MUX) that enables accurate measurement of the dark current in cryogenic silicon photomultipliers (SiPMs), achieving a sensitivity equivalent to detecting less than one avalanche per second. Dynamic pulse-counting measurements were used as a benchmark for reconstructing the dark current in static IV measurements. The IV-MUX features 15 channels on a single board and up to seven boards can be connected in parallel under the control of one Arduino microcontroller. To minimize leakage and enhance performance, the layout includes guard rings and high-isolation relays, enabling resolution of currents as small as 49 fA. The IV-MUX can be integrated into systems designed for IV or pulse-counting measurements, enabling seamless switching between IV and pulse-counting modes. Moreover, the IV-MUX is vacuum-compatible, validated by testing an SiPM array in a cryostat. This feature reduces the need for multiple feedthroughs when testing sensor arrays in vacuum. The design is open source and can be used to facilitate rapid and automated testing of SiPMs or similar low-current devices in one measurement cycle.
