Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner
Carlos Rodriguez-Pardo, David Pascual-Hernandez, Javier Rodriguez-Vazquez, Jorge Lopez-Moreno, Elena Garces
TL;DR
This work enables high-resolution, realistic material digitization from any flatbed scanner by decoupling shading and specular highlights through a cycle-consistent, residual delighting network that yields albedo $I_d$, followed by SVBSDF estimation to recover per-pixel opacity $O$ and transmittance $T$ along with normals and other BRDF components. The material model extends previous approaches with a thin-layer transmission component, using a physically-based BSDF $f_{l,v}^{BSDF}(A,N,S,R,O,T) = O \cdot ( \frac{A}{\pi} + s_{l,v}(N,S,R) ) + (T \cdot A)$ to capture both reflectance and transmission effects. The method is trained with cycle-consistency losses, attention-guided networks, and extensive data augmentation, and evaluated on a large scanner-based dataset with render-aware metrics (BRDF/BTDF/BSDF) and ablation studies showing the value of the delighting and residual components. The approach proves robust across devices, including smartphones, and provides a scalable path toward realistic, high-resolution material appearance suitable for SVBSDF-based rendering in virtual environments. This work promises practical impact for industries requiring accurate digital material replicas without expensive hardware or expert supervision.
Abstract
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy
