Process Resilience under Optimal Data Injection Attacks
Xiuzhen Ye, Wentao Tang
TL;DR
The paper develops an information-theoretic framework to study process resilience under optimal data injection attacks (DIAs) on linear stochastic systems. Attacks are modeled as Gaussian injections that maximize disruption of the stationary joint distribution of states and estimates while minimizing detection likelihood, governed by a tunable weight $\lambda$. It provides analytical results for full attacks (including convexity conditions and a Lyapunov-type solution) and a practical greedy algorithm for $k$-sparse attacks, with numerical validation on a two-CSTR plant showing sensor-level vulnerability patterns and Pareto tradeoffs between disruption and stealth. The work offers a principled basis for assessing and improving sensor resilience in cyber-physical processes, while highlighting assumptions (linearity, full-knowledge) and avenues for extending to nonlinear and partial-knowledge settings.
Abstract
In this paper, we study the resilience of process systems in an {\it information-theoretic framework}, from the perspective of an attacker capable of optimally constructing data injection attacks. The attack aims to distract the stationary distributions of process variables and stay stealthy, simultaneously. The problem is formulated as designing a multivariate Gaussian distribution to maximize the Kullback-Leibler divergence between the stationary distributions of states and state estimates under attacks and without attacks, while minimizing that between the distributions of sensor measurements. When the attacker has limited access to sensors, sparse attacks are proposed by incorporating a sparsity constraint. {We conduct theoretical analysis on the convexity of the attack construction problem and present a greedy algorithm, which enables systematic assessment of measurement vulnerability, thereby offering insights into the inherent resilience of process systems. We numerically evaluate the performance of proposed constructions on a two-reactor process.
