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Ion-Trap Chip Architecture Optimized for Implementation of Quantum Error-Correcting Code

Jeonghoon Lee, Hyeongjun Jeon, Taehyun Kim

TL;DR

The paper tackles scalable fault-tolerant quantum computation with trapped ions by introducing a chip architecture that uses orthogonal horizontal and vertical connectivity to support transversal and non-transversal gates plus syndrome extraction under a 2D color code. It combines a dedicated transpiler, scheduler, and error analyzer to demonstrate that increasing the color-code distance by two substantially reduces the effective logical two-qubit gate error to around $p_{2Q}^{*} \sim 10^{-7}$–$10^{-8}$ when using a $[[31,1,7]]$ code, enabling reliable execution of large circuits. Although QEC introduces runtime overhead from error-correction cycles and shuttling, the results show improved success probabilities for benchmarks and the potential to scale to thousands of logical qubits depending on the algorithm. The work provides a practical, hardware-conscious pathway from the NISQ era to fault-tolerant trapped-ion quantum computing, with clear directions for further optimization and integration of sympathetic cooling.

Abstract

We propose a scalable trapped-ion quantum-computing architecture that efficiently incorporates quantum error correction. The chip design exploits orthogonal qubit connectivity by assigning horizontal trap regions to transversal logical gates and vertical regions to non-transversal gates and syndrome extraction, thereby enabling universal gate operations with minimal ion shuttling and reduced hardware complexity. Using a dedicated software tool, we evaluate the architecture on several benchmark algorithms and scheduling policies for two-dimensional color code of varying code distance. Our results demonstrate that increasing the code distance by two reduces the effective logical two-qubit gate error probability by approximately two orders of magnitude, reaching values as low as $10^{-8}$ with the $[[31, 1, 7]]$ color code. This improvement substantially expands the range of algorithms that can be executed reliably, up to scales of a few thousand logical qubits, depending on the algorithmic structure. Overall, these findings validate the practicality and scalability of the proposed architecture and its control strategies, highlighting a viable route toward fault-tolerant, trapped-ion quantum computing.

Ion-Trap Chip Architecture Optimized for Implementation of Quantum Error-Correcting Code

TL;DR

The paper tackles scalable fault-tolerant quantum computation with trapped ions by introducing a chip architecture that uses orthogonal horizontal and vertical connectivity to support transversal and non-transversal gates plus syndrome extraction under a 2D color code. It combines a dedicated transpiler, scheduler, and error analyzer to demonstrate that increasing the color-code distance by two substantially reduces the effective logical two-qubit gate error to around when using a code, enabling reliable execution of large circuits. Although QEC introduces runtime overhead from error-correction cycles and shuttling, the results show improved success probabilities for benchmarks and the potential to scale to thousands of logical qubits depending on the algorithm. The work provides a practical, hardware-conscious pathway from the NISQ era to fault-tolerant trapped-ion quantum computing, with clear directions for further optimization and integration of sympathetic cooling.

Abstract

We propose a scalable trapped-ion quantum-computing architecture that efficiently incorporates quantum error correction. The chip design exploits orthogonal qubit connectivity by assigning horizontal trap regions to transversal logical gates and vertical regions to non-transversal gates and syndrome extraction, thereby enabling universal gate operations with minimal ion shuttling and reduced hardware complexity. Using a dedicated software tool, we evaluate the architecture on several benchmark algorithms and scheduling policies for two-dimensional color code of varying code distance. Our results demonstrate that increasing the code distance by two reduces the effective logical two-qubit gate error probability by approximately two orders of magnitude, reaching values as low as with the color code. This improvement substantially expands the range of algorithms that can be executed reliably, up to scales of a few thousand logical qubits, depending on the algorithmic structure. Overall, these findings validate the practicality and scalability of the proposed architecture and its control strategies, highlighting a viable route toward fault-tolerant, trapped-ion quantum computing.
Paper Structure (24 sections, 9 equations, 11 figures, 3 tables, 2 algorithms)

This paper contains 24 sections, 9 equations, 11 figures, 3 tables, 2 algorithms.

Figures (11)

  • Figure 1: Orthogonal connectivity requirements for transversal versus non-transversal gates and syndrome extraction. For the case of the $[[7, 1, 3]]$ code, each logical qubit is encoded using seven physical qubits. Transversal two-qubit gates require the qubit connectivity represented by the horizontal lines. In contrast, non-transversal gates and syndrome extraction require interactions with auxiliary qubits, represented by the vertical double line.
  • Figure 2: Configuration of the proposed chip layout featuring horizontal trap regions (H-trap regions) and vertical sectors (V sectors) to support diverse qubit-connectivity requirements, with parameters $n=7,C=5, N=8, L=3$, and $L_e=1$. $n$ H-trap regions, each containing a chain of $C$ ions, are arranged in parallel to form a horizontal sector (H sector). V sectors are placed between H sectors and connected to the auxiliary-qubit module. Note that RF electrodes are omitted for clarity, and the figure is not to scale; the actual sizes, numbers, and shapes of components, including ions and electrodes, will differ in practice. Sets of electrodes that share a common voltage are co-wired and shown in the same color; for clarity, not all such sets are displayed.
  • Figure 3: Ion configurations at time step $t$ and $t+1$ during right-shuttling phase. The figure is drawn with parameters $n=7,C=5, N=8, L=3$, and $L_e=1$.
  • Figure 4: Flow of stages in the software tool, consisting of three main stages: the transpiler, the scheduler, and the error analyzer.
  • Figure 5: Chip models assumed by the scheduler. (a) The model of the proposed chip, where each H sector is represented by a horizontal chain of logical qubits ($C=5$) and each V sector is represented as a single logical qubit. (b) The model of linearly concatenated chains for simulation without a QEC code.
  • ...and 6 more figures