AEON: Adaptive Estimation of Instance-Dependent In-Distribution and Out-of-Distribution Label Noise for Robust Learning
Arpit Garg, Cuong Nguyen, Rafael Felix, Yuyuan Liu, Thanh-Toan Do, Gustavo Carneiro
TL;DR
This work tackles robust image classification under realistic instance-dependent label noise that includes both in-distribution and out-of-distribution errors. It introduces AEON, a one-stage framework that jointly estimates instance-dependent noise rates $\hat{\eta}^{id}$ and $\hat{\eta}^{ood}$ using a dual-stream soft-masking mechanism, enabling end-to-end learning with supervised, unsupervised, and contrastive objectives. A novel ID+OOD instance-dependent benchmark is proposed, and AEON demonstrates state-of-the-art performance on synthetic benchmarks like CIFAR-100 and ciFAIR-100 and on real-world datasets such as Clothing1M, mini-WebVision, and WebFG-496, with competitive or superior calibration. The method offers practical benefits through efficient computation, scalable training, and improved robustness to complex noise, paving the way for automatic, instance-aware noise handling in large-scale, semi-supervised learning settings.
Abstract
Robust training with noisy labels is a critical challenge in image classification, offering the potential to reduce reliance on costly clean-label datasets. Real-world datasets often contain a mix of in-distribution (ID) and out-of-distribution (OOD) instance-dependent label noise, a challenge that is rarely addressed simultaneously by existing methods and is further compounded by the lack of comprehensive benchmarking datasets. Furthermore, even though current noisy-label learning approaches attempt to find noisy-label samples during training, these methods do not aim to estimate ID and OOD noise rates to promote their effectiveness in the selection of such noisy-label samples, and they are often represented by inefficient multi-stage learning algorithms. We propose the Adaptive Estimation of Instance-Dependent In-Distribution and Out-of-Distribution Label Noise (AEON) approach to address these research gaps. AEON is an efficient one-stage noisy-label learning methodology that dynamically estimates instance-dependent ID and OOD label noise rates to enhance robustness to complex noise settings. Additionally, we introduce a new benchmark reflecting real-world ID and OOD noise scenarios. Experiments demonstrate that AEON achieves state-of-the-art performance on both synthetic and real-world datasets
