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Multi-Source Unsupervised Domain Adaptation with Prototype Aggregation

Min Huang, Zifeng Xie, Bo Sun, Ning Wang

TL;DR

This work tackles multi-source unsupervised domain adaptation by introducing PAMDA, a prototype-based framework that simultaneously models class- and domain-level discrepancies with a group of learned prototypes. It employs a similarity-based transferability weighting to selectively align source prototypes to target features and to utilize only reliable target pseudo-labels for target-prototype construction, thereby mitigating noise and negative transfer. The method optimizes a dual objective that combines source supervision with prototype-guided alignment, formalized through class- and domain-prototype discrepancies $D_c$ and $D_d$, and supported by a theoretical bound on target error that is reduced as $L_{cls}$ and $D$ are minimized. Empirically, PAMDA achieves state-of-the-art or competitive performance on three standard MSDA benchmarks (Digits-5, Office-Caltech-10, Office-31), with ablations and visualizations corroborating the effectiveness of class- and domain-level prototype alignment and the robustness to hyperparameter choices.

Abstract

Multi-source domain adaptation (MSDA) plays an important role in industrial model generalization. Recent efforts on MSDA focus on enhancing multi-domain distributional alignment while omitting three issues, e.g., the class-level discrepancy quantification, the unavailability of noisy pseudo-label, and source transferability discrimination, potentially resulting in suboptimal adaption performance. Therefore, we address these issues by proposing a prototype aggregation method that models the discrepancy between source and target domains at the class and domain levels. Our method achieves domain adaptation based on a group of prototypes (i.e., representative feature embeddings). A similarity score-based strategy is designed to quantify the transferability of each domain. At the class level, our method quantifies class-specific cross-domain discrepancy according to reliable target pseudo-labels. At the domain level, our method establishes distributional alignment between noisy pseudo-labeled target samples and the source domain prototypes. Therefore, adaptation at the class and domain levels establishes a complementary mechanism to obtain accurate predictions. The results on three standard benchmarks demonstrate that our method outperforms most state-of-the-art methods. In addition, we provide further elaboration of the proposed method in light of the interpretable results obtained from the analysis experiments.

Multi-Source Unsupervised Domain Adaptation with Prototype Aggregation

TL;DR

This work tackles multi-source unsupervised domain adaptation by introducing PAMDA, a prototype-based framework that simultaneously models class- and domain-level discrepancies with a group of learned prototypes. It employs a similarity-based transferability weighting to selectively align source prototypes to target features and to utilize only reliable target pseudo-labels for target-prototype construction, thereby mitigating noise and negative transfer. The method optimizes a dual objective that combines source supervision with prototype-guided alignment, formalized through class- and domain-prototype discrepancies and , and supported by a theoretical bound on target error that is reduced as and are minimized. Empirically, PAMDA achieves state-of-the-art or competitive performance on three standard MSDA benchmarks (Digits-5, Office-Caltech-10, Office-31), with ablations and visualizations corroborating the effectiveness of class- and domain-level prototype alignment and the robustness to hyperparameter choices.

Abstract

Multi-source domain adaptation (MSDA) plays an important role in industrial model generalization. Recent efforts on MSDA focus on enhancing multi-domain distributional alignment while omitting three issues, e.g., the class-level discrepancy quantification, the unavailability of noisy pseudo-label, and source transferability discrimination, potentially resulting in suboptimal adaption performance. Therefore, we address these issues by proposing a prototype aggregation method that models the discrepancy between source and target domains at the class and domain levels. Our method achieves domain adaptation based on a group of prototypes (i.e., representative feature embeddings). A similarity score-based strategy is designed to quantify the transferability of each domain. At the class level, our method quantifies class-specific cross-domain discrepancy according to reliable target pseudo-labels. At the domain level, our method establishes distributional alignment between noisy pseudo-labeled target samples and the source domain prototypes. Therefore, adaptation at the class and domain levels establishes a complementary mechanism to obtain accurate predictions. The results on three standard benchmarks demonstrate that our method outperforms most state-of-the-art methods. In addition, we provide further elaboration of the proposed method in light of the interpretable results obtained from the analysis experiments.

Paper Structure

This paper contains 19 sections, 17 equations, 5 figures, 4 tables.

Figures (5)

  • Figure 1: Different transferability of source domains.
  • Figure 2: Overview of PAMDA. PAMDA is established on a group of prototypes. (a) Each class prototype is generated according to reliable labels. (b) We design two discrepancy metrics for diverse confidence pseudo-labeled target samples. At the class level, a class-prototype aggregation discrepancy is adopted for class alignment across multiple domains. At the domain level, we adopt a domain-prototype aggregation discrepancy for cross-domain alignment based on a group of domain prototypes (i.e., the mean of all class prototypes in the same domain). (c) Last but not least, we design a source classification loss and a prototype classification loss to drive the model to learn the supervised knowledge from source data and class prototypes, respectively.
  • Figure 3: Hyperparameter analysis of $\tau_c$ and $\tau_d$ on Digits-5
  • Figure 4: Feature distributions on the “$\rightarrow mm$” task of Digits-5.
  • Figure 5: Class weight distributions on the “$\rightarrow mm$” task of Digits-5.