Acquisition of Spatially-Varying Reflectance and Surface Normals via Polarized Reflectance Fields
Jing Yang, Pratusha Bhuvana Prasad, Qing Zhang, Yajie Zhao
TL;DR
The paper tackles the challenging problem of simultaneously acquiring object geometry and spatially varying reflectance under complex, real-world lighting. It introduces polarized reflectance fields captured with a multi-view OLAT setup, and a three-stage pipeline (data preprocessing, initialization, optimization) to robustly separate diffuse/specular components and recover per-pixel normals and SVBRDF parameters. Key contributions include a practical polarized capture workflow, artifact-reduction strategies (overexposure, inter-reflection, lens flare, occlusion), and a rigorous optimization framework that yields accurate $\rho_d$, $\rho_s$, $n_d$, $n_s$, $\varsigma$, $\gamma$, and $\sigma$, validated via relighting and qualitative comparisons. The work enables realistic rendering and provides a valuable training dataset for inverse rendering, with potential extensions to neural methods for handling challenging inter-reflection scenarios and moving subjects.
Abstract
Accurately measuring the geometry and spatially-varying reflectance of real-world objects is a complex task due to their intricate shapes formed by concave features, hollow engravings and diverse surfaces, resulting in inter-reflection and occlusion when photographed. Moreover, issues like lens flare and overexposure can arise from interference from secondary reflections and limitations of hardware even in professional studios. In this paper, we propose a novel approach using polarized reflectance field capture and a comprehensive statistical analysis algorithm to obtain highly accurate surface normals (within 0.1mm/px) and spatially-varying reflectance data, including albedo, specular separation, roughness, and anisotropy parameters for realistic rendering and analysis. Our algorithm removes image artifacts via analytical modeling and further employs both an initial step and an optimization step computed on the whole image collection to further enhance the precision of per-pixel surface reflectance and normal measurement. We showcase the captured shapes and reflectance of diverse objects with a wide material range, spanning from highly diffuse to highly glossy - a challenge unaddressed by prior techniques. Our approach enhances downstream applications by offering precise measurements for realistic rendering and provides a valuable training dataset for emerging research in inverse rendering. We will release the polarized reflectance fields of several captured objects with this work.
