ONER: Online Experience Replay for Incremental Anomaly Detection
Yizhou Jin, Jiahui Zhu, Guodong Wang, Shiwei Li, Jinjin Zhang, Xinyue Liu, Qingjie Liu, Yunhong Wang
TL;DR
The paper tackles incremental anomaly detection in dynamic industrial settings, where catastrophic forgetting and cross-task feature conflicts hinder continual performance. It introduces ONER, an end-to-end online experience replay framework that combines decomposed prompts (learnable per-task components that reuse frozen past parameters) with semantic prototypes (image- and pixel-level feature banks) to preserve prior knowledge while adapting to new tasks. Through modules like Image-level Prototypes Refinement, Experience Replay-based Optimization, and Incremental Selection of Pixel-level Prototypes, ONER achieves state-of-the-art pixel-level and image-level anomaly detection on MVTec AD and VisA with very low training overhead (0.019M parameters and 5 epochs per task). The approach demonstrates strong scalability and practicality for real-world deployment, delivering robust discrimination and localization without revisiting old data, and enabling rapid adaptation to new product types and production schedules. Overall, ONER provides a data-efficient, stable solution for continual industrial anomaly detection that balances performance, efficiency, and memory usage.
Abstract
Incremental anomaly detection aims to sequentially identify defects in industrial product lines but suffers from catastrophic forgetting, primarily due to knowledge overwriting during parameter updates and feature conflicts between tasks. In this work, We propose ONER (ONline Experience Replay), an end-to-end framework that addresses these issues by synergistically integrating two types of experience: (1) decomposed prompts, which dynamically generate image-conditioned prompts from reusable modules to retain prior knowledge thus prevent knowledge overwriting, and (2) semantic prototypes, which enforce separability in latent feature spaces at pixel and image levels to mitigate cross-task feature conflicts. Extensive experiments demonstrate the superiority of ONER, achieving state-of-the-art performance with +4.4% Pixel AUROC and +28.3% Pixel AUPR improvements on the MVTec AD dataset over prior methods. Remarkably, ONER achieves this with only 0.019M parameters and 5 training epochs per task, confirming its efficiency and stability for real-world industrial deployment.
