Device-independent prepare-and-prepare bipartite null witness dimension test with a single joint measurement

Josep Batle; Tomasz Białecki; Tomasz Rybotycki; Adam Bednorz

Paper

Device-independent prepare-and-prepare bipartite null witness dimension test with a single joint measurement

Abstract

We propose a device-independent null witness dimensionality test with bipartite measurements and input from two separate parties. The dimension is determined from the rank of the matrix of measurements for pairs of states prepared by the parties. We have applied the test to various IBM Quantum devices. The results demonstrate extreme precision of the test, which is able to detect disagreements with the qubit (two-level) space of bipartite measurement even in the presence of technical imperfections. The deviations beyond 6 standard deviations have no simple origin and need urgent explanations to unblock progress in quantum computing.