A Metric on the Polycrystalline Microstructure State Space
Dylan Miley, Ethan Suwandi, Benjamin Schweinhart, Jeremy K Mason
TL;DR
This work introduces a general framework to compare polycrystalline microstructures by modeling each microstructure as a probability distribution of local windows sampled from micrographs, forming a microstructure state space. A Wasserstein-based metric, specifically using an unbalanced formulation for grain-boundary mass, quantifies the distance between window distributions, enabling statistically meaningful comparisons of grain geometry below a chosen length scale. The authors implement a practical pipeline—defining a grain boundary mass function on windows, discussing computational strategies (OT, entropic regularization, and assignment-based methods), and validating with DREAM.3D-generated microstructures, including a proof-of-concept microstructure database to demonstrate querying capabilities. This framework aims to support ICME by enabling reproducibility checks, pathway optimization, and property interpolation across broadly defined microstructures, with future work to incorporate phase and orientation information.
Abstract
Material microstructures are traditionally compared using sets of statistical measures that are incomplete, e.g., two visually distinct microstructures can have identical grain size distributions and phase fractions. While this is not a severe concern for materials fabricated by traditional means, the microstructures produced by advanced manufacturing methods can depend sensitively and unpredictably on the processing conditions. Moreover, the advent of computational materials design has increased the frequency of synthetic microstructure generation, and there is not yet a standard approach in the literature to validate the generated microstructures with experimental ones. This work proposes an idealized distance on the space of single-phase polycrystalline microstructures such that two microstructures that are close with respect to the distance exhibit statistically similar grain geometries in all respects below a user-specified length scale. Given a pair of micrographs, the distance is approximated by sampling windows from the micrographs, defining a distance between pairs of windows, and finding a window matching that minimizes the sum of pairwise window distances. The approach is used to compare a variety of synthetic microstructures and to develop a procedure to query a proof-of-concept database suitable for general single-phase polycrystalline microstructures.
