Flux-pump induced degradation of $T_1$ for dissipative cat qubits
Léon Carde, Pierre Rouchon, Joachim Cohen, Alexandru Petrescu
TL;DR
The paper addresses pump-induced degradation of T1 in dissipative cat qubits realized with ATS-based circuits. It develops an effective master equation via time-dependent Schrieffer-Wolff perturbation theory and validates it against Floquet simulations, revealing drive-dependent parity-breaking single-photon losses and higher-order processes that threaten phase-flip protection. The study identifies dominant loss channels (e.g., linear drive on the memory mode) and demonstrates good agreement between SWPT and Floquet theory for moderate pump powers, providing a spectral and impedance-based understanding of the decoherence pathways. It then proposes mitigation via canceling linear drive terms through careful ATS flux control and by designing the mode frequencies and filtering to suppress pump-induced decays, offering practical guidance for preserving the cat-qubit error bias in experiments and extending the approach to other circuit implementations. The work highlights how to maintain κ_1 ≪ κ_2 to keep the error-correction threshold viable and informs experimental design and parameter tuning for robust dissipative quantum information processing.
Abstract
Dissipative stabilization of cat qubits autonomously corrects for bit flip errors by ensuring that reservoir-engineered two-photon losses dominate over other mechanisms inducing phase flip errors. To describe the latter, we derive an effective master equation for an asymmetrically threaded SQUID based superconducting circuit used to stabilize a dissipative cat qubit. We analyze the dressing of relaxation processes under drives in time-dependent Schrieffer-Wolff perturbation theory for weakly anharmonic bosonic degrees of freedom, and in numerically exact Floquet theory. We find that spurious single-photon decay rates can increase under the action of the parametric pump that generates the required interactions for cat-qubit stabilization. Our analysis feeds into mitigation strategies that can inform current experiments, and the methods presented here can be extended to other circuit implementations.
