A discrete de Rham discretization of interface diffusion problems with application to the Leaky Dielectric Model
Daniele A. Di Pietro, Simon Mendez, Aurelio Edoardo Spadotto
TL;DR
This work develops a high-order discrete de Rham discretization for elliptic interface problems with potential and flux jumps, allowing unfitted cuts of the interface on general polytopal meshes. Interface conditions are enforced weakly via Nitsche-type terms and trace reconstructions, with diffusion-weighted averages ensuring robustness to large coefficient contrasts. The authors prove stability and optimal-order error estimates in an energy-like norm and demonstrate robust, convergent behavior on square, circular, and generic interfaces, including curved interfaces. The method is extended to a time-dependent Leaky Dielectric Model with a capacitive interface jump, and numerical tests validate both spatial and temporal convergence, highlighting the framework’s applicability to moving-interface electrohydrodynamics.
Abstract
Motivated by the study of the electrodynamics of particles, we propose in this work an arbitrary-order discrete de Rham scheme for the treatment of elliptic problems with potential and flux jumps across a fixed interface. The scheme seamlessly supports general elements resulting from the cutting of a background mesh along the interface. Interface conditions are enforced weakly à la Nitsche. We provide a rigorous convergence of analysis of the scheme for a steady model problem and showcase an application to a physical problem inspired by the Leaky Dielectric Model.
