Foundational Model for Electron Micrograph Analysis: Instruction-Tuning Small-Scale Language-and-Vision Assistant for Enterprise Adoption
Sakhinana Sagar Srinivas, Chidaksh Ravuru, Geethan Sannidhi, Venkataramana Runkana
TL;DR
The paper tackles the challenge of interpreting high-resolution electron micrographs in semiconductor manufacturing where labeled data are scarce. It introduces MAEMI, a small-scale vision-language assistant trained through instruction tuning on synthetic data generated by large multimodal models and distilled from large models to compact, open-source backbones, enabling on-premises deployment with strong privacy. Key technical contributions include dynamic low-rank adapters (DyLoRA-FA), weight-only quantization (WOQ), and a data-generation pipeline using GPT-4 Turbo with Vision to create image-question-answer triplets from the SEM dataset, supporting zero-/few-shot VQA and image captioning. Empirical results show MAEMI achieves superior or competitive performance against baselines on captioning and VQA tasks, generalizes to open-source material datasets, and offers a practical path for enterprise adoption with low-cost hardware and on-site data privacy. Overall, the work advances practical, privacy-preserving multimodal analysis of electron micrographs with potential impact on quality control and process optimization in semiconductor manufacturing.
Abstract
Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We introduce a small-scale multimodal framework for analyzing semiconductor electron microscopy images (MAEMI) through vision-language instruction tuning. We generate a customized instruction-following dataset using large multimodal models on microscopic image analysis. We perform knowledge transfer from larger to smaller models through knowledge distillation, resulting in improved accuracy of smaller models on visual question answering (VQA) tasks. This approach eliminates the need for expensive, human expert-annotated datasets for microscopic image analysis tasks. Enterprises can further finetune MAEMI on their intellectual data, enhancing privacy and performance on low-cost consumer hardware. Our experiments show that MAEMI outperforms traditional methods, adapts to data distribution shifts, and supports high-throughput screening.
