Vision HgNN: An Electron-Micrograph is Worth Hypergraph of Hypernodes
Sakhinana Sagar Srinivas, Rajat Kumar Sarkar, Sreeja Gangasani, Venkataramana Runkana
TL;DR
This work tackles the challenge of classifying electron micrographs, which exhibit complex, multi-scale patterns and long-tailed category distributions. It introduces Vision-HgNN, a hypergraph neural network that learns visual hypergraphs from image patches via HgSL and performs relational inference with HgAT and HgT, followed by HgRo readout to predict material categories. The approach achieves state-of-the-art performance on SEM datasets, with strong ablation support showing the complementary benefits of local/global hyperedge-node attention and long-range dependencies, while remaining efficient on large image collections. The framework promises broader applicability across electron microscopy modalities and downstream material-characterization tasks such as anomaly detection and segmentation.
Abstract
Material characterization using electron micrographs is a crucial but challenging task with applications in various fields, such as semiconductors, quantum materials, batteries, etc. The challenges in categorizing electron micrographs include but are not limited to the complexity of patterns, high level of detail, and imbalanced data distribution(long-tail distribution). Existing methods have difficulty in modeling the complex relational structure in electron micrographs, hindering their ability to effectively capture the complex relationships between different spatial regions of micrographs. We propose a hypergraph neural network(HgNN) backbone architecture, a conceptually alternative approach, to better model the complex relationships in electron micrographs and improve material characterization accuracy. By utilizing cost-effective GPU hardware, our proposed framework outperforms popular baselines. The results of the ablation studies demonstrate that the proposed framework is effective in achieving state-of-the-art performance on benchmark datasets and efficient in terms of computational and memory requirements for handling large-scale electron micrograph-based datasets.
