Measurement-device agnostic quantum tomography
Robert Stárek, Martin Bielak, Miroslav Ježek
TL;DR
The paper addresses systematic errors in quantum tomography caused by mismatches between actual measurement operators and those assumed during reconstruction, which distort tomographic characterizations of quantum states. It introduces a measurement-device agnostic tomography framework based on self-calibrating probe states distributed quasi-uniformly on the Bloch sphere, using reconstruction artifacts to infer the true measurement operators $\hat{\pi}_j$. By optimizing an assumed error vector $\vec{\delta}'$ to minimize the state-dependent purity modulation $\Delta P$, the method remains robust to noise and scalable to multi-qubit and device tomography, without requiring perfect probe states. Experimental demonstrations on polarization-encoded qubits show substantial fidelity improvements (e.g., $F_{\min}=0.9907(2)$, $F=0.997(3)$) and successful application to on-chip path qubits, highlighting practical utility for photonic quantum technologies. The approach generalizes to other tomography schemes and state preparation calibration, offering a versatile tool for accurate quantum characterization in complex devices.
Abstract
Characterization of quantum states and devices is paramount to quantum science and technology. The characterization consists of individual measurements, which must be precisely known. A mismatch between actual and assumed constituent measurements limits the accuracy of this characterization. We show that such a mismatch introduces reconstruction artifacts in quantum state tomography. We use these artifacts to detect and quantify the mismatch, gaining information about the actual measurement operators. It consequently allows the mitigation of systematic errors in both quantum measurement and state preparation, improving the precision of state control and characterization. The practical utility of our approach is experimentally demonstrated.
