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RowPress Vulnerability in Modern DRAM Chips

Haocong Luo, Ataberk Olgun, A. Giray Yağlıkçı, Yahya Can Tuğrul, Steve Rhyner, Meryem Banu Cavlak, Joël Lindegger, Mohammad Sadrosadati, Onur Mutlu

TL;DR

RowPress identifies a new DRAM read-disturb mechanism caused by long aggressor-row open times ($t_{\text{AggON}}$) that can flip bits without thousands of activations, distinct from RowHammer. The authors perform large-scale real-device characterization across $164$ DDR4 chips, demonstrate a proof-of-concept RowPress attack on a system with RowHammer protections, and propose a mitigation framework that adapts RowHammer defenses to RowPress. Key findings show RowPress is widespread, temperature-sensitive, and largely operates via a different failure mechanism than RowHammer, with potential to be triggered by a single aggressor activation under long open times. The work has practical industry impact by prompting updates to mitigation strategies, memory-controller policies, and standards, and it provides open-source tools to enable replication and further study of read disturbance in DRAM.

Abstract

Memory isolation is a critical property for system reliability, security, and safety. We demonstrate RowPress, a DRAM read disturbance phenomenon different from the well-known RowHammer. RowPress induces bitflips by keeping a DRAM row open for a long period of time instead of repeatedly opening and closing the row. We experimentally characterize RowPress bitflips, showing their widespread existence in commodity off-the-shelf DDR4 DRAM chips. We demonstrate RowPress bitflips in a real system that already has RowHammer protection, and propose effective mitigation techniques that protect DRAM against both RowHammer and RowPress.

RowPress Vulnerability in Modern DRAM Chips

TL;DR

RowPress identifies a new DRAM read-disturb mechanism caused by long aggressor-row open times () that can flip bits without thousands of activations, distinct from RowHammer. The authors perform large-scale real-device characterization across DDR4 chips, demonstrate a proof-of-concept RowPress attack on a system with RowHammer protections, and propose a mitigation framework that adapts RowHammer defenses to RowPress. Key findings show RowPress is widespread, temperature-sensitive, and largely operates via a different failure mechanism than RowHammer, with potential to be triggered by a single aggressor activation under long open times. The work has practical industry impact by prompting updates to mitigation strategies, memory-controller policies, and standards, and it provides open-source tools to enable replication and further study of read disturbance in DRAM.

Abstract

Memory isolation is a critical property for system reliability, security, and safety. We demonstrate RowPress, a DRAM read disturbance phenomenon different from the well-known RowHammer. RowPress induces bitflips by keeping a DRAM row open for a long period of time instead of repeatedly opening and closing the row. We experimentally characterize RowPress bitflips, showing their widespread existence in commodity off-the-shelf DDR4 DRAM chips. We demonstrate RowPress bitflips in a real system that already has RowHammer protection, and propose effective mitigation techniques that protect DRAM against both RowHammer and RowPress.

Paper Structure

This paper contains 13 sections, 5 figures, 1 table.

Figures (5)

  • Figure 1: $AC_{min}$ distributions of conventional RowHammer (RH) and three representative cases of RowPress (RP) at $80^{\circ}C$ across 164 DDR4 chips from manufacturers S, H, and M.
  • Figure 2: Our DDR4 DRAM testing infrastructure.
  • Figure 3: How changes as tAggON increases.
  • Figure 4: Single-sided minus double-sided at $50^{\circ}C$ (first row) and $80^{\circ}C$ (second row).
  • Figure 5: Number of RowHammer vs. RowPress bitflips (left) and number of rows with bitflips (right) we observe after running our proof of concept test programs with Algorithm 1 (blue bars) and Algorithm 2 (purple bars) with four (top), three (middle), and two (bottom) activations per aggressor row per iteration.