Bayesian Adaptive Calibration and Optimal Design
Rafael Oliveira, Dino Sejdinovic, David Howard, Edwin V. Bonilla
TL;DR
BACON tackles calibrating computer models under expensive simulations by treating design selection and calibration as a joint Bayesian adaptive design problem. It replaces intractable expected information gain with a variational lower bound, enabling simultaneous optimization of designs, calibration inputs, and a flexible posterior (including conditional normalising flows). The approach leverages a bi-fidelity Gaussian process to couple real observations and simulator outputs, achieving superior information gain and posterior accuracy compared to baselines, especially in multimodal settings. Scalability is addressed through sparse GP extensions and amortised inference ideas, broadening applicability to physics- and engineering-scale calibration tasks.
Abstract
The process of calibrating computer models of natural phenomena is essential for applications in the physical sciences, where plenty of domain knowledge can be embedded into simulations and then calibrated against real observations. Current machine learning approaches, however, mostly rely on rerunning simulations over a fixed set of designs available in the observed data, potentially neglecting informative correlations across the design space and requiring a large amount of simulations. Instead, we consider the calibration process from the perspective of Bayesian adaptive experimental design and propose a data-efficient algorithm to run maximally informative simulations within a batch-sequential process. At each round, the algorithm jointly estimates the parameters of the posterior distribution and optimal designs by maximising a variational lower bound of the expected information gain. The simulator is modelled as a sample from a Gaussian process, which allows us to correlate simulations and observed data with the unknown calibration parameters. We show the benefits of our method when compared to related approaches across synthetic and real-data problems.
