Reducing Mid-Circuit Measurements via Probabilistic Circuits
Yanbin Chen, Innocenzo Fulginiti, Christian B. Mendl
TL;DR
Mid-circuit measurements impose significant hardware and classical feedback overhead in dynamic quantum circuits. The authors present a static optimization that replaces certain mid-circuit measurement snippets with probabilistic circuit components, enabled by extending Quantum Constant Propagation (QCP) with a compile-time analysis and a purity test to identify pure-input cases. They model circuit uncertainty through ensembles and probabilistic gates, showing a polynomial-time optimization in the number of qubits $n$, gates $g$, maximum controls $c$, and mid-circuit measurements $m$. Demonstrations on two dynamic circuits illustrate substantial reductions in runtime overhead and a shift from dynamic to static execution components, with potential practical impact for quantum hardware efficiency and error-correction workflows.
Abstract
Mid-circuit measurements and measurement-controlled gates are supported by an increasing number of quantum hardware platforms and will become more relevant as an essential building block for quantum error correction. However, mid-circuit measurements impose significant demands on the quantum hardware due to the required signal analysis and classical feedback loop. This work presents a static circuit optimization algorithm that can substitute some of these measurements with an equivalent circuit with randomized gate applications. Our method uses ideas from constant propagation to classically precompute measurement outcome probabilities. Our proposed optimization is efficient, as its runtime scales polynomially on the number of qubits and gates of the circuit.
