A Compact Delay Model for OTS Devices
M. M. Al Chawa, R. Tetzlaff, D. Bedau, J. W. Reiner, D. A. Stewart, M. K. Grobis
TL;DR
This paper addresses the need for efficient, SPICE-friendly models of Ovonic Threshold Switch devices whose I–V behavior features current-controlled negative differential resistance and abrupt threshold switching. It introduces a compact delay-based internal state variable integrated into a five-junction OTS equivalent circuit to achieve a SPICE-compatible representation. A closed-form i(v, v_R) expression is derived and coupled with an off-state leakage model, with parameters fitted to Se-based OTS devices from Western Digital Research. The results show good agreement with experimental data, including snapback behavior, providing a practical tool for circuit designers of OTS-based selectors, switches, and neuromorphic applications.
Abstract
This paper presents a novel compact delay model of Ovonic Threshold Switch (OTS) devices that works efficiently for circuit simulations. The internal state variable of the two terminal devices is estimated using a delay system that uses a few electrical components related to a suggested equivalent circuit of the device. Finally, we tested the proposed model against measured data from devices fabricated by Western Digital Research.
