Learning to Cut via Hierarchical Sequence/Set Model for Efficient Mixed-Integer Programming
Jie Wang, Zhihai Wang, Xijun Li, Yufei Kuang, Zhihao Shi, Fangzhou Zhu, Mingxuan Yuan, Jia Zeng, Yongdong Zhang, Feng Wu
TL;DR
The paper tackles the MILP cut-selection problem by addressing what cuts to pick, how many to pick, and in what order. It introduces HEM, a bi-level hierarchical model that first predicts the number of cuts and then selects an ordered subset via Seq2Seq/Set2Seq policies, enabling explicit modeling of order and interaction among cuts. Empirical results across nine benchmarks, including large-scale Huawei and Google problems, show that HEM and its extension HEM++ substantially improve solving time and the primal-dual gap integral compared to strong baselines and prior learning methods. The authors also extract human-readable order rules from learned policies and demonstrate applicability to real-world solvers, indicating practical impact for data-driven MILP solving.
Abstract
Cutting planes (cuts) play an important role in solving mixed-integer linear programs (MILPs), which formulate many important real-world applications. Cut selection heavily depends on (P1) which cuts to prefer and (P2) how many cuts to select. Although modern MILP solvers tackle (P1)-(P2) by human-designed heuristics, machine learning carries the potential to learn more effective heuristics. However, many existing learning-based methods learn which cuts to prefer, neglecting the importance of learning how many cuts to select. Moreover, we observe that (P3) what order of selected cuts to prefer significantly impacts the efficiency of MILP solvers as well. To address these challenges, we propose a novel hierarchical sequence/set model (HEM) to learn cut selection policies. Specifically, HEM is a bi-level model: (1) a higher-level module that learns how many cuts to select, (2) and a lower-level module -- that formulates the cut selection as a sequence/set to sequence learning problem -- to learn policies selecting an ordered subset with the cardinality determined by the higher-level module. To the best of our knowledge, HEM is the first data-driven methodology that well tackles (P1)-(P3) simultaneously. Experiments demonstrate that HEM significantly improves the efficiency of solving MILPs on eleven challenging MILP benchmarks, including two Huawei's real problems.
