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Immediate recapture in the trapping-detrapping process of a single charge carrier

Aleksejus Kononovicius, Bronislovas Kaulakys

Abstract

Previously we have shown that pure 1/f noise arises from the trapping-detrapping process when traps are heterogeneous. Namely, the trapping-detrapping process relies on the assumption that detrapping rates of individual trapping centers in the condensed matter are random and uniformly distributed. Another assumption underlying the trapping-detrapping process was that both trapping and detrapping times need to have non-zero duration. Here we violate the latter assumption by introducing immediate recapture of the charge carrier. We show that 1/f noise will still be observed, though the range of frequencies over which it will be observed shifts to the lower frequency range as the immediate recapture probability increases.

Immediate recapture in the trapping-detrapping process of a single charge carrier

Abstract

Previously we have shown that pure 1/f noise arises from the trapping-detrapping process when traps are heterogeneous. Namely, the trapping-detrapping process relies on the assumption that detrapping rates of individual trapping centers in the condensed matter are random and uniformly distributed. Another assumption underlying the trapping-detrapping process was that both trapping and detrapping times need to have non-zero duration. Here we violate the latter assumption by introducing immediate recapture of the charge carrier. We show that 1/f noise will still be observed, though the range of frequencies over which it will be observed shifts to the lower frequency range as the immediate recapture probability increases.
Paper Structure (5 sections, 11 equations, 5 figures)

This paper contains 5 sections, 11 equations, 5 figures.

Figures (5)

  • Figure 1: Sample signal generated by the trapping--detrapping of a single charge carrier. Relevant notation: $\tau_{i}$ -- detrapping time (gap duration), $\theta_{i}$ -- trapping time (pulse duration), $a$ -- current generated by a free--drifting charge carrier (pulse height).
  • Figure 2: Probability density function of the detrapping time distribution under the assumption that individual detrapping rates are uniformly distributed in $\left[\gamma_{\text{min}},\gamma_{\text{max}}\right]$ (red curve), Eq. \ref{['eq:escape-time-pdf']}. The probability density function was obtained with $\gamma_{\text{min}}=10^{-3}$ and $\gamma_{\text{max}}=10$. Black dashed curves correspond to the exponential probability density functions with fixed rates: $\gamma_{\tau}=10^{-3}$, $2.78\times10^{-3}$, $7.74\times10^{-3}$, $2.15\times10^{-2}$, $5.99\times10^{-2}$, $1.67\times10^{-1}$, $4.64\times10^{-1}$, $1.29$, $3.59$, and $10$. Normalization of the exponential probability density functions was adjusted for the visualization purposes, but it remains proportional to their respective contributions.
  • Figure 3: Rescaled simulated PSD curves of the trapping--detrapping process with immediate recapture mechanism. Common simulation parameters: $T=10^{6}$, $\gamma_{\text{min}}=10^{-4}$, $\gamma_{\text{max}}=10^{4}$, $a=1$, $\gamma_{\theta}=1$.
  • Figure 4: Rescaled simulated PSD curves of the trapping--detrapping process with immediate ejection mechanism. Common simulation parameters: $T=10^{6}$, $\gamma_{\text{min}}=10^{-4}$, $\gamma_{\text{max}}=10^{4}$, $a=1$, $\gamma_{\theta}=1$.
  • Figure 5: Simulated conditional PSD curves of the trapping--detrapping process with immediate ejection mechanism. Common simulation parameters: $T_{\text{min}}=10^{6}$, $N_{\text{min}}=10^{6}$, $\gamma_{\text{min}}=10^{-2}$, $\gamma_{\text{max}}=10^{4}$, $a=1$, $\gamma_{\theta}=1$.