Addressing Label Leakage in Knowledge Tracing Models
Yahya Badran, Christine Preisach
TL;DR
Knowledge Tracing models that expand item interactions into KC-level sequences can suffer label leakage, where correlations among KCs of the same item reveal ground-truth labels. The authors propose a leakage-free framework with multiple leakage-prevention strategies, including mask labeling (MASK), averaged KC embeddings (DKT-Fuse), specialized attention masks (AKT-QM), and autoregressive decoding (DKT-AD), plus variants like DKT-ML and AKT-ML. Across diverse datasets with varying KC-per-item characteristics, these leakage-free methods consistently outperform their leakage-prone counterparts and competitive baselines, with AKT-ML often achieving top performance. The work underscores the practical impact of leakage in DLKT and provides KTbench as an open-source tool to support reproducibility and broader application in ITS contexts.
Abstract
Knowledge Tracing (KT) is concerned with predicting students' future performance on learning items in intelligent tutoring systems. Learning items are tagged with skill labels called knowledge concepts (KCs). Many KT models expand the sequence of item-student interactions into KC-student interactions by replacing learning items with their constituting KCs. This approach addresses the issue of sparse item-student interactions and minimises the number of model parameters. However, we identified a label leakage problem with this approach. The model's ability to learn correlations between KCs belonging to the same item can result in the leakage of ground truth labels, which leads to decreased performance, particularly on datasets with a high number of KCs per item. In this paper, we present methods to prevent label leakage in knowledge tracing (KT) models. Our model variants that utilize these methods consistently outperform their original counterparts. This further underscores the impact of label leakage on model performance. Additionally, these methods enhance the overall performance of KT models, with one model variant surpassing all tested baselines on different benchmarks. Notably, our methods are versatile and can be applied to a wide range of KT models.
