Controller for rejection of the first harmonic in a periodic signal with uncertain delay
Viktor Novičenko, Šarūnas Vaitekonis
TL;DR
This work addresses canceling only the first harmonic of a periodic disturbance with an unknown dead time between plant and controller. It designs a harmonics-based, linear time-invariant controller built from a bank of coupled harmonic oscillators (modified system of harmonic oscillators) using the internal model principle, ensuring rejection of the fundamental sine component while preserving all higher harmonics. Stability analysis with unknown delays reveals delay-dependent regions, including delay-induced stability, and shows that in the infinite-harmonic limit the stability condition becomes $\alpha>0$ and $\beta/\omega>-1/4$, with practical parameter choices providing robust operation up to a fraction of the period. The controller is motivated by rotational AFM tilt compensation and demonstrated via simulations, with extensions proposed to cancel additional harmonics, handle unknown frequencies, or integrate Smith predictors for longer delays, enabling larger scanning areas in high-speed AFM applications.
Abstract
The plant (the system to be controlled) is disturbed by a periodic external force with a broad spectrum of Fourier harmonics. The first Fourier harmonic (sine-type signal) is assumed to be undesirable and should be removed by a control force, whereas the other harmonics should be preserved without distortion. Because the measured plant data have an unknown amount of time delay (dead time) and the sensitivity of the plant to external force is unknown, therefore the amplitude and phase of a sine-type control force are also unknown. Based on the internal model principle, we developed a feedback controller described as a linear time-invariant system that can remove the first harmonic from the plant's output by constantly adjusting its control force parameters. Using this controller, we aimed to further extend the capabilities of a newly developed high-speed, large-area rotational scanning atomic force microscopy. In such a scanning technique, the sample is rotated, and the tilt angle between the normal of the sample surface and the axis of rotation produces a parasitic first Fourier harmonic, which significantly limits the scanning area.
