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On the Second-Order Asymptotics of the Hoeffding Test and Other Divergence Tests

K. V. Harsha, Jithin Ravi, Tobias Koch

TL;DR

This work analyzes binary hypothesis testing with known null $P$ and unknown alternative $Q$, focusing on the Hoeffding test and a broader class of divergence tests ${ ext T}_n^D(r)$. It derives exact first- and second-order asymptotics for the type-II error under a fixed type-I constraint, showing that all divergence tests share the same first-order term $D_{ ext{KL}}(P\, Vert Q)$ as the Neyman-Pearson test, but their second-order terms depend on the chosen divergence. Invariant divergences yield the same second-order term as the Hoeffding test, while non-invariant divergences can outperform Hoeffding for some $Q$, indicating potential benefits for composite tests with partial knowledge of the alternative. The results are supported by a generalized chi-square tail approximation and extensive numerical experiments illustrating when different tests have the best finite-sample performance and how the cardinality of the alphabet impacts scalability.

Abstract

Consider a binary statistical hypothesis testing problem, where $n$ independent and identically distributed random variables $Z^n$ are either distributed according to the null hypothesis $P$ or the alternative hypothesis $Q$, and only $P$ is known. A well-known test that is suitable for this case is the so-called Hoeffding test, which accepts $P$ if the Kullback-Leibler (KL) divergence between the empirical distribution of $Z^n$ and $P$ is below some threshold. This work characterizes the first and second-order terms of the type-II error probability for a fixed type-I error probability for the Hoeffding test as well as for divergence tests, where the KL divergence is replaced by a general divergence. It is demonstrated that, irrespective of the divergence, divergence tests achieve the first-order term of the Neyman-Pearson test, which is the optimal test when both $P$ and $Q$ are known. In contrast, the second-order term of divergence tests is strictly worse than that of the Neyman-Pearson test. It is further demonstrated that divergence tests with an invariant divergence achieve the same second-order term as the Hoeffding test, but divergence tests with a non-invariant divergence may outperform the Hoeffding test for some alternative hypotheses $Q$. Potentially, this behavior could be exploited by a composite hypothesis test with partial knowledge of the alternative hypothesis $Q$ by tailoring the divergence of the divergence test to the set of possible alternative hypotheses.

On the Second-Order Asymptotics of the Hoeffding Test and Other Divergence Tests

TL;DR

This work analyzes binary hypothesis testing with known null and unknown alternative , focusing on the Hoeffding test and a broader class of divergence tests . It derives exact first- and second-order asymptotics for the type-II error under a fixed type-I constraint, showing that all divergence tests share the same first-order term as the Neyman-Pearson test, but their second-order terms depend on the chosen divergence. Invariant divergences yield the same second-order term as the Hoeffding test, while non-invariant divergences can outperform Hoeffding for some , indicating potential benefits for composite tests with partial knowledge of the alternative. The results are supported by a generalized chi-square tail approximation and extensive numerical experiments illustrating when different tests have the best finite-sample performance and how the cardinality of the alphabet impacts scalability.

Abstract

Consider a binary statistical hypothesis testing problem, where independent and identically distributed random variables are either distributed according to the null hypothesis or the alternative hypothesis , and only is known. A well-known test that is suitable for this case is the so-called Hoeffding test, which accepts if the Kullback-Leibler (KL) divergence between the empirical distribution of and is below some threshold. This work characterizes the first and second-order terms of the type-II error probability for a fixed type-I error probability for the Hoeffding test as well as for divergence tests, where the KL divergence is replaced by a general divergence. It is demonstrated that, irrespective of the divergence, divergence tests achieve the first-order term of the Neyman-Pearson test, which is the optimal test when both and are known. In contrast, the second-order term of divergence tests is strictly worse than that of the Neyman-Pearson test. It is further demonstrated that divergence tests with an invariant divergence achieve the same second-order term as the Hoeffding test, but divergence tests with a non-invariant divergence may outperform the Hoeffding test for some alternative hypotheses . Potentially, this behavior could be exploited by a composite hypothesis test with partial knowledge of the alternative hypothesis by tailoring the divergence of the divergence test to the set of possible alternative hypotheses.
Paper Structure (30 sections, 13 theorems, 184 equations, 8 figures)

This paper contains 30 sections, 13 theorems, 184 equations, 8 figures.

Key Result

Lemma 6

Let $Z^{n}$ be a sequence of i.i.d. random variables distributed according to the null hypothesis $P$, and let $D$ be a divergence. Further let $\bm{\lambda}=(\lambda_{1}, \ldots, \lambda_{k-1})^{\mathsf{T}}$ be a vector that contains the eigenvalues of the matrix $\bm{\Sigma}_{\mathbf{P}}^{-1/2}\bm for all $c > 0$ and some positive sequence $\{\delta_{n}\}$ that is independent of $c$ and satisfie

Figures (8)

  • Figure 1: Inverse tail probability functions of the Normal and chi-square distributions as a function of $\epsilon$.
  • Figure 2: Ratio $\rho(P,Q,\epsilon)$ of the second-order terms of the Hoeffding test ${\mathsf{T}}^{D_{\textnormal{KL}}}_n(r)$ and the divergence test ${\mathsf{T}}^{D_{\textnormal{SM}}}_n(r)$ as a function of $\mathbf{Q}$ for $\epsilon=0.02$.
  • Figure 3: Ratio $\rho(P,Q,\epsilon)$ of the second-order terms of the Hoeffding test ${\mathsf{T}}^{D_{\textnormal{KL}}}_n(r)$ and the divergence test ${\mathsf{T}}^{D_{\textnormal{SM}}}_n(r)$ as a function of $Q_1$ for $Q_2=0.5$ and $\epsilon=0.02$.
  • Figure 4: Ratio $\rho(P,Q,\epsilon)$ of the second-order terms of the Hoeffding test ${\mathsf{T}}^{D_{\textnormal{KL}}}_n(r)$ and the divergence test ${\mathsf{T}}^{D_{\textnormal{SM}}}_n(r)$ as a function of $\mathbf{Q}$ for $P=(0.1,0.3,0.6)$.
  • Figure 5: Type-I error vs. type-II error for $P=(0.15, 0.6, 0.25)$ and $n=500$.
  • ...and 3 more figures

Theorems & Definitions (25)

  • Definition 1
  • Remark 2
  • Definition 3
  • Remark 4
  • Definition 5
  • Lemma 6
  • proof
  • Theorem 7
  • proof
  • Remark 8
  • ...and 15 more