Ab initio modelling of quantum dot qubits: Coupling, gate dynamics and robustness versus charge noise
Hamza Jnane, Simon C Benjamin
TL;DR
The paper tackles predicting two-qubit gate performance for silicon quantum-dot qubits in realistic devices by developing a real-space, ab initio grid model that directly computes exchange coupling $J$ and the dynamics of a ${\sqrt{\text{SWAP}}}$ gate. It introduces both 3D and efficient quasi-2D treatments, enabling accurate yet computationally tractable predictions of gate fidelity and qubit leakage in the presence of static and dynamic charge noise. The study shows how to characterize $J(V_g)$ from first principles, demonstrates near-ideal gate operation in clean environments, and demonstrates robustness through a fully compensating nine-pulse sequence that mitigates charge-noise and magnetic-detuning errors, albeit with longer gate times. The results provide a practical pathway to screen device layouts and tailor control pulses for high-fidelity two-qubit operations in semiconductor quantum processors.
Abstract
Electron spins in semiconductor devices are highly promising building blocks for quantum processors (QPs). Commercial semiconductor foundries can create QPs using the same processes employed for conventional chips, once the QP design is suitably specified. There is a vast accessible design space; to identify the most promising options for fabrication, one requires predictive modelling of interacting electrons in real geometries and complex non-ideal environments. In this work we explore a modelling method based on real-space grids, an ab initio approach without assumptions relating to device topology and therefore with wide applicability. Given an electrode geometry, we determine the exchange coupling between quantum dot qubits, and model the full evolution of a $\sqrt{\text{SWAP}}$ gate to predict qubit loss and infidelity rates for various voltage profiles. We determine full, 3D solutions and introduce a method which can obtain near-identical predictions using far more efficient 2D computations. Moreover we explore the impact of unwanted charge defects (static and dynamic) in the environment, and test robust pulse sequences. As an example we exhibit a sequence correcting both systematic errors and (unknown) charge defects, observing an order of magnitude boost in fidelity. The technique can thus identify the most promising device designs for fabrication, as well as bespoke control sequences for each such device.
