A 2D Sinogram-Based Approach to Defect Localization in Computed Tomography
Yuzhong Zhou, Linda-Sophie Schneider, Fuxin Fan, Andreas Maier
TL;DR
This work tackles defect localization in CT by operating in sinogram space rather than the reconstructed image domain. It introduces a three-step deep learning pipeline—sinogram segmentation with a U-Net, instance segmentation via skeletonization and reclassification, and defect analysis from projection geometry—to detect and localize defects directly in sinograms, achieving a mean IoU of $0.9202$ and a defect position error of $1.3$ pixels on a $512$-detector. The approach demonstrates strong performance on simulated 2D parallel-beam data (MagicCube) and, to a lesser extent, on KiTS23 medical volumes, suggesting potential for real-time defect detection and integration with reconstruction workflows. Future work aims to extend the method to 3D and cone-beam geometries, moving beyond simulated projections toward practical CT applications.
Abstract
The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed Tomography. However, many defect detection algorithms are applied directly to the reconstructed domain, often disregarding the raw sensor data. This paper shifts the focus to the use of sinograms. Within this framework, we present a comprehensive three-step deep learning algorithm, designed to identify and analyze defects within objects without resorting to image reconstruction. These three steps are defect segmentation, mask isolation, and defect analysis. We use a U-Net-based architecture for defect segmentation. Our method achieves the Intersection over Union of 92.02% on our simulated data, with an average position error of 1.3 pixels for defect detection on a 512-pixel-wide detector.
