On The Capacity of Low-Rank Dyadic Fading Channels in the Low-SNR Regime
Kamal Singh
TL;DR
This paper analyzes the capacity of low-rank, dyadic (pinhole) fading channels in the low-$SNR$ regime under perfect CSI. It uses a double-Nakagami-$m$ model with h = h_T h_R, deriving the end-to-end gain distribution and an asymptotic low-$SNR$ capacity bound: $C \approx \left(\frac{\Omega_T \Omega_R}{m_T m_R}\right) \frac{\mathrm{SNR}}{4} \log^2\left(\frac{1}{\mathrm{SNR}}\right)$. A key finding is that capacity increases as the fading severity grows (i.e., smaller $m_T m_R$), due to improvements in the tail distribution of the channel gain and the ability to exploit rare high-gain events at very low $SNR$. The results are validated numerically and extend to multi-antenna pinhole channels by a multiplicative gain factor, underscoring a counter-intuitive yet practically relevant advantage of higher fading severity for low-power, short-range communications.
Abstract
We characterize the capacity of a low-rank wireless channel with varying fading severity at low signal-to-noise ratios (SNRs). The channel rank deficiency is achieved by incorporating pinhole condition. The capacity degradation with fading severity at high SNRs is well known: the probability of deep fades increases significantly with higher fading severity resulting in poor performance. Our analysis of the dyadic pinhole channel at low-SNR shows a very counter-intuitive result that - \emph{higher fading severity enables higher capacity at sufficiently low SNR}. The underlying reason is that at low SNRs, ergodic capacity depends crucially on the probability distribution of channel peaks (tail distribution); for the pinhole channel, the tail distribution improves with fading severity. This allows a transmitter operating at low SNR to exploit channel peaks `more efficiently' and hence improves spectral efficiency. We derive a new key result quantifying the above dependence for the double-Nakagami-$m$ fading pinhole channel - the capacity ${C} \propto (m_T m_R)^{-1}$ at low SNR, where $m_T m_R$ is the severity parameters (product) of the fadings involved.
