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Self-testing of semisymmetric informationally complete measurements in a qubit prepare-and-measure scenario

Gábor Drótos, Károly F. Pál, Tamás Vértesi

TL;DR

This work develops an analytic framework for self-testing a one-parameter family of four-outcome qubit POVMs, the semi-SIC POVMs, in a semi-device-independent prepare-and-measure scenario with a dimension bound. The authors first self-test four pure qubit states using a two-parameter witness, then relate these states to the semi-SIC Bloch vectors by matching dot products, deriving explicit relations c1(B) and c2(B) that certify the semi-SIC structure for $B\in(1/16,1/12]$. They extend the witness to include a fourth measurement setting, showing that the extended POVM must also be semi-SIC with opposite Bloch vectors, thereby self-testing the full semi-SIC POVM in the PM framework. In the SIC limit ($B=1/12$) they recover $Q=4\sqrt{3}$, illustrating the method's consistency with known SIC self-testing results and highlighting a path toward self-testing any extremal qubit POVM in a minimal PM configuration. The results provide a concrete, analytic route to certify extremal measurements in a minimal semi-DI setting, with potential extensions to noisy scenarios and broader classes of extremal POVMs.

Abstract

Self-testing is a powerful method for certifying quantum systems. Initially proposed in the device-independent (DI) setting, self-testing has since been relaxed to the semi-device-independent (semi-DI) setting. In this study, we focus on the self-testing of a specific type of non-projective qubit measurements belonging to a one-parameter family, using the semi-DI prepare-and-measure (PM) scenario. Remarkably, we identify the simplest PM scenario discovered so far, involving only four preparations and four measurements, for self-testing the fourth measurement. This particular measurement is a four-outcome non-projective positive operator-valued measure (POVM) and falls in the class of semisymmetric informationally complete (semi-SIC) POVMs introduced by Geng et al. [Phys. Rev. Lett. 126, 100401 (2021)]. To achieve this, we develop analytical techniques for semi-DI self-testing in the PM scenario. Our results shall pave the way towards self-testing any extremal qubit POVM within a potentially minimal PM scenario.

Self-testing of semisymmetric informationally complete measurements in a qubit prepare-and-measure scenario

TL;DR

This work develops an analytic framework for self-testing a one-parameter family of four-outcome qubit POVMs, the semi-SIC POVMs, in a semi-device-independent prepare-and-measure scenario with a dimension bound. The authors first self-test four pure qubit states using a two-parameter witness, then relate these states to the semi-SIC Bloch vectors by matching dot products, deriving explicit relations c1(B) and c2(B) that certify the semi-SIC structure for . They extend the witness to include a fourth measurement setting, showing that the extended POVM must also be semi-SIC with opposite Bloch vectors, thereby self-testing the full semi-SIC POVM in the PM framework. In the SIC limit () they recover , illustrating the method's consistency with known SIC self-testing results and highlighting a path toward self-testing any extremal qubit POVM in a minimal PM configuration. The results provide a concrete, analytic route to certify extremal measurements in a minimal semi-DI setting, with potential extensions to noisy scenarios and broader classes of extremal POVMs.

Abstract

Self-testing is a powerful method for certifying quantum systems. Initially proposed in the device-independent (DI) setting, self-testing has since been relaxed to the semi-device-independent (semi-DI) setting. In this study, we focus on the self-testing of a specific type of non-projective qubit measurements belonging to a one-parameter family, using the semi-DI prepare-and-measure (PM) scenario. Remarkably, we identify the simplest PM scenario discovered so far, involving only four preparations and four measurements, for self-testing the fourth measurement. This particular measurement is a four-outcome non-projective positive operator-valued measure (POVM) and falls in the class of semisymmetric informationally complete (semi-SIC) POVMs introduced by Geng et al. [Phys. Rev. Lett. 126, 100401 (2021)]. To achieve this, we develop analytical techniques for semi-DI self-testing in the PM scenario. Our results shall pave the way towards self-testing any extremal qubit POVM within a potentially minimal PM scenario.
Paper Structure (11 sections, 66 equations, 2 figures)

This paper contains 11 sections, 66 equations, 2 figures.

Figures (2)

  • Figure 1: The Bloch vectors \ref{['h1to4']} of a semi-SIC POVM for (a) $B = 1/15$ and (b) $B = 1/12$. Note that panel (b) corresponds to a SIC POVM.
  • Figure 2: The prepare-and-measure scenario considered in this study. Panel (a) shows the setup corresponding to the first part of the self-testing problem, while panel (b) shows its extension.