Bell sampling from quantum circuits
Dominik Hangleiter, Michael J. Gullans
TL;DR
Bell sampling introduces a universal quantum-computation model based on measuring two copies of a circuit's output in the transversal Bell basis, producing samples that are classically hard to simulate yet encode rich diagnostic information about the circuit. The authors prove universality, provide complexity-theoretic evidence for classical hardness, and develop practical protocols to extract circuit properties, including fidelity estimation, depth testing, and learning of low-$T$ Clifford+$T$ circuits, treating Bell samples as a classical shadow of the circuit. They also demonstrate error-detection/correction advantages, discuss robustness to noise, and adapt existing noisy-simulation frameworks to Bell sampling, highlighting both the potential for near-term quantum advantage demonstrations and the challenges of efficient classical simulation under realistic noise. The work positions Bell sampling as a realistic, benchmarkable pathway toward fault-tolerant quantum-computation verification with direct classical validation from Bell-sample data, while outlining open questions about noise robustness and scalable simulation.
Abstract
A central challenge in the verification of quantum computers is benchmarking their performance as a whole and demonstrating their computational capabilities. In this work, we find a universal model of quantum computation, Bell sampling, that can be used for both of those tasks and thus provides an ideal stepping stone towards fault-tolerance. In Bell sampling, we measure two copies of a state prepared by a quantum circuit in the transversal Bell basis. We show that the Bell samples are classically intractable to produce and at the same time constitute what we call a circuit shadow: from the Bell samples we can efficiently extract information about the quantum circuit preparing the state, as well as diagnose circuit errors. In addition to known properties that can be efficiently extracted from Bell samples, we give several new and efficient protocols: an estimator of state fidelity, a test for the depth of the circuit and an algorithm to estimate a lower bound to the number of T gates in the circuit. With some additional measurements, our algorithm learns a full description of states prepared by circuits with low T-count.
