A Contrastive Learning Scheme with Transformer Innate Patches
Sander Riisøen Jyhne, Per-Arne Andersen, Morten Goodwin
TL;DR
This work tackles accurate aerial image segmentation under class imbalance and fine-grained class boundaries by leveraging the intrinsic patch structure of vision transformers. It proposes Contrastive Transformer (CT), a patch-based, end-to-end contrastive learning scheme that performs intra- and inter-image sampling guided by ground-truth masks and applies losses at multiple encoder stages. Together with a standard segmentation objective, CT yields consistent mean IoU improvements across three backbones (Swin, UnetFormer, PoolFormer) on the ISPRS Potsdam dataset using InfoNCE or a cosine-based contrastive loss. The approach is memory-efficient, avoids large batch requirements, and generalizes across architectures, offering a practical route to enhance dense prediction in aerial and potentially other domains.
Abstract
This paper presents Contrastive Transformer, a contrastive learning scheme using the Transformer innate patches. Contrastive Transformer enables existing contrastive learning techniques, often used for image classification, to benefit dense downstream prediction tasks such as semantic segmentation. The scheme performs supervised patch-level contrastive learning, selecting the patches based on the ground truth mask, subsequently used for hard-negative and hard-positive sampling. The scheme applies to all vision-transformer architectures, is easy to implement, and introduces minimal additional memory footprint. Additionally, the scheme removes the need for huge batch sizes, as each patch is treated as an image. We apply and test Contrastive Transformer for the case of aerial image segmentation, known for low-resolution data, large class imbalance, and similar semantic classes. We perform extensive experiments to show the efficacy of the Contrastive Transformer scheme on the ISPRS Potsdam aerial image segmentation dataset. Additionally, we show the generalizability of our scheme by applying it to multiple inherently different Transformer architectures. Ultimately, the results show a consistent increase in mean IoU across all classes.
